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Amorphous Silicon TFTs: Material Characterization, Device Operation, and Bias Stress Modeling

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Author:Holly C. Slade, M.S. Shur, S.C. Deane, M. Hack
Parent Title (English):The Electrochemical Society Extended Abstracts
Document Type:Conference Proceeding
Language:English
Publication Year:1995
Tag:Thin Film Transistors
Volume:95
Issue:2
First Page:861