Amorphous Silicon TFTs: Material Characterization, Device Operation, and Bias Stress Modeling
Author: | Holly C. Slade, M.S. Shur, S.C. Deane, M. Hack |
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Parent Title (English): | The Electrochemical Society Extended Abstracts |
Document Type: | Conference Proceeding |
Language: | English |
Publication Year: | 1995 |
Tag: | Thin Film Transistors |
Volume: | 95 |
Issue: | 2 |
First Page: | 861 |