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Reliability analysis of power MOSFET’s with the help of compact models and circuit simulation

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Author:A. Castellazzi, R. Kraus, Norbert SeligerORCiD, D. Schmitt-Landsiedel
DOI:https://doi.org/10.1016/S0026-2714(02)00198-1
ISSN:0026-2714
Parent Title (German):Microelectronics Reliability
Document Type:Article (peer reviewed)
Language:English
Publication Year:2002
Volume:42
Issue:9
Page Number:6
First Page:1605
Last Page:1610
faculties / departments:Fakultät für Ingenieurwissenschaften