Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress
Author: | C. Fürböck, M. Litzenberger, D. Pogany, E. Gornik, Norbert SeligerORCiD, T. Müller-Lynch, M. Stecher, H. Goßner, W. Werner |
---|---|
DOI: | https://doi.org/10.1016/S0026-2714(99)00124-9 |
ISSN: | 0026-2714 |
Parent Title (German): | Microelectronics Reliability |
Document Type: | Article (peer reviewed) |
Language: | English |
Publication Year: | 1999 |
Volume: | 39 |
Issue: | 6 |
Page Number: | 6 |
First Page: | 925 |
Last Page: | 930 |
faculties / departments: | Fakultät für Ingenieurwissenschaften |