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Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress

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Author:C. Fürböck, M. Litzenberger, D. Pogany, E. Gornik, Norbert SeligerORCiD, T. Müller-Lynch, M. Stecher, H. Goßner, W. Werner
DOI:https://doi.org/10.1016/S0026-2714(99)00124-9
ISSN:0026-2714
Parent Title (German):Microelectronics Reliability
Document Type:Article (peer reviewed)
Language:English
Publication Year:1999
Volume:39
Issue:6
Page Number:6
First Page:925
Last Page:930
faculties / departments:Fakultät für Ingenieurwissenschaften