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Internal Characterisation of IGBTs Using the Backside Laserprober Technique

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Metadaten
Author:C. Fürböck, R. Thalhammer, M. Litzenberger, Norbert SeligerORCiD, D. Pogany, E. Gornik, G. Wachutka
ISBN:3-901678-04-8
Parent Title (English):Jahrestagung der GMe, Bad Hofgastein Tagungsband 1999
Publisher:Gesellschaft für Mikroelektronik (GMe)
Document Type:Conference Proceeding
Language:English
Publication Year:1999
Tag:IGBT
Peer reviewed:Nein
faculties / departments:Fakultät für Ingenieurwissenschaften
Dewey Decimal Classification:6 Technik, Medizin, angewandte Wissenschaften / 60 Technik / 600 Technik, Technologie