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Reliability aspects of semiconductor devices in high temperature applications

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Author:W. Kanert, H. Dettmer, B. Plikat, Norbert SeligerORCiD
DOI:https://doi.org/10.1016/S0026-2714(03)00313-5
ISSN:0026-2714
Parent Title (German):Microelectronics Reliability
Document Type:Article (peer reviewed)
Language:English
Publication Year:2003
Volume:43
Issue:9
Page Number:8
First Page:1839
Last Page:1846
faculties / departments:Fakultät für Ingenieurwissenschaften