TY - JOUR A1 - Versen, Martin A1 - Ernst, W. A1 - Gulati, P. A1 - Singh, G. T1 - Test setup for reliability studies of DDR2 SDRAM JF - Microelectronics Reliability N2 - A DDR2 DRAM test setup is developed and implemented on the Griffin III ATE test system from HILEVEL Technologies. The test system provides a raw platform for performing various mixed signal and digital tests. In order to configure patterns easily in a vector format, a software platform is developed to manage test patterns according to the user's analysis needs. As examples, retention test patterns with disabled self-refresh are applied to 2 Gbit DDR2 SDRAM of two different DRAM vendors. The devices are characterized in respect to their intrinsic leakage and data retention behavior under the influence of stress conditions such as temperature or access algorithm. The tests are automated and test data is logged for an off-line data analysis. Data is recorded before and after solder simulation steps in order to observe a retention time degradation. KW - Microelectronics KW - DRAM retention solder simulation Y1 - 2018 ER - TY - JOUR A1 - Heitauer, Mathias A1 - Versen, Martin T1 - Evaluation of a Co-Simulation Approach for Functional Verification of Analog and Mixed Signal Devices JF - EDFA Technical Articles N2 - This article presents an automation workflow for the development of analog and mixed-signal devices similar to the two-stage process used for the design and verification of logic ICs. The use of a co-simulation interface makes it possible to build and verify failure models. KW - delta-sigma converter KW - functional verification KW - mixed signal devices KW - model-based development KW - system simulation Y1 - 2021 U6 - https://doi.org/10.31399/asm.edfa.2021-3.p008 VL - 23 IS - 3 SP - 8 EP - 12 ER - TY - JOUR A1 - Leiter, Nina A1 - Wohlschläger, Maximilian A1 - Versen, Martin T1 - Analysis of the phase-dependent fluorescence decay time of treated wood using FD-FLIM JF - tm - Technisches Messen N2 - For sustainable handling of wood and high material utilization, post-consumer wood has to be sorted by post-consumer wood categories in Germany. The non-destructive FD-FLIM method could improve the wood recycling process by automatic classification of waste wood into post-consumer wood classes. Thus, the phase-dependent fluorescence decay time of treated wood is analysed in this study to obtain the impact of the treatment on the fluorescence decay time. It is shown that treated and untreated wood can be differentiated using the fluorescence decay time, although the state-of-the-art theoretical fluorescence decay time differs from the experimentally determined fluorescence decay time. N2 - Für einen nachhaltigen Umgang mit Holz und eine hohe stoffliche Verwertung muss Altholz in Deutschland nach Altholzklassen sortiert werden. Die zerstörungsfreie FD-FLIM-Methode könnte den Holzrecyclingprozess durch eine automatische Klassifizierung von Altholz in Altholzklassen verbessern. Daher wird in dieser Studie die phasenabhängige Fluoreszenzabklingzeit von behandeltem Holz analysiert, um den Einfluss der Behandlung auf die Fluoreszenzabklingzeit zu ermitteln. Es wird gezeigt, dass behandeltes und unbehandeltes Holz anhand der Fluoreszenzabklingzeit unterschieden werden kann, auch wenn die nach dem Stand der Forschung theoretische Fluoreszenzabklingzeit von der experimentell ermittelten Fluoreszenzabklingzeit abweicht. KW - fluorescence KW - decay time KW - FD-FLIM KW - lifetime KW - wood Y1 - 2023 U6 - https://doi.org/10.1515/teme-2022-0114 VL - 90 IS - 6 SP - 401 EP - 406 ER -