TY - JOUR A1 - Coquery, G. A1 - Lefranc, G. A1 - Licht, T. A1 - Lallemand, R. A1 - Seliger, Norbert A1 - Berg, H. T1 - High temperature reliability on automotive power modules verified by power cycling tests up to 150°C JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(03)00318-4 SN - 0026-2714 VL - 43 IS - 9 SP - 1871 EP - 1876 ER - TY - JOUR A1 - Seliger, Norbert A1 - Wolfgang, E. A1 - Lefranc, G. A1 - Berg, H. A1 - Licht, T. T1 - Reliable power electronics for automotive applications JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(02)00197-X SN - 0026-2714 VL - 42 IS - 9-11 SP - 1597 EP - 1604 ER - TY - CHAP A1 - Wolfgang, E. A1 - Lefranc, G. A1 - Seliger, Norbert A1 - Berg, H. A1 - Licht, T. T1 - Zuverlässige Leistungselektronik für die Automobiltechnik T2 - ETG-Tagung Bauelemente der Leistungselektronik und ihre Anwendungen KW - Power electronics Y1 - 2023 PB - ETG CY - Bad Nauheim ER -