TY - JOUR A1 - Ackermann, N A1 - Gutewort, V. A1 - Quinque, M. A1 - Kühne, M. A1 - Stein v. Kamienski, E. A1 - Schulze, Achim A1 - Wichtendahl, R. T1 - Final testing: a secure release gate towards module manufacturing JF - Photovoltaics International KW - Photovoltaik KW - Module manufacturing Y1 - 2010 IS - 8 ER -