TY - CHAP A1 - Pogany, D. A1 - Seliger, Norbert A1 - Lalinsky, T. A1 - Kuzmik, J. A1 - Habas, P. A1 - Hrkut, P. A1 - Gornik, E. T1 - Study of thermal effects in GaAs micromachined power sensor microsystems by an optical interferometer technique T2 - International Workshop on Thermal Investigation of ICs and Systems (THERMINIC' 96) Y1 - 2023 SP - 185 EP - 190 ER - TY - CHAP A1 - Pogany, D. A1 - Lalinsky, T. A1 - Seliger, Norbert A1 - Kuzmik, J. A1 - Habas, P. A1 - Hrkut, P. A1 - Gornik, E. T1 - Power Sensor Microsystems Characterization using a contactless optical laser method T2 - International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM' 96) Y1 - 2023 SP - 201 EP - 204 ER - TY - JOUR A1 - Pogany, D. A1 - Seliger, Norbert A1 - Lalinsky, T. A1 - Kuzmik, J. A1 - Habas, P. A1 - Hrkut, P. A1 - Gornik, E. T1 - Study of Thermal Effects in GaAs Micromachined Power Sensor Microsystems by an Optical Interferometer Technique JF - Microelectronics Journal Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2692(97)00057-8 VL - 29 IS - 4-5 SP - 191 EP - 198 ER - TY - CHAP A1 - Pogany, D. A1 - Fuerboeck, C. A1 - Seliger, Norbert A1 - Habas, P. A1 - Gornik, E. A1 - Kubicek, S. A1 - Decoutere, S. ED - Grünbacher, H. T1 - Optical Testing of submicron-technology MOSFETs and bipolar transistors T2 - European Solid-State Device Research Conference (ESSDERC' 97) Y1 - 2023 UR - https://ieeexplore.ieee.org/document/1503373 SP - 372 EP - 375 ER - TY - CHAP A1 - Seliger, Norbert A1 - Habas, P. A1 - Gornik, E. ED - Baccarani, G. ED - Rudan, M. T1 - Time Domain Characterization of lattice heating in power VDMOSFETs by means of an interferometric laserprobe technique T2 - Proceedings of the 26th European Solid State Device Research Conference (ESSDERC' 96) Y1 - 2023 UR - https://ieeexplore.ieee.org/document/5435968 SP - 847 EP - 850 ER - TY - CHAP A1 - Seliger, Norbert A1 - Habas, P. A1 - Gornik, E. ED - de Graaf, H. C. ED - van Kranenburg, H. T1 - Modeling and measurements of backside laserprobe signals in MOSFETs T2 - European Conference on Solid-State Device Research (ESSDERC' 95) Y1 - 2023 UR - https://ieeexplore.ieee.org/document/5436126 SP - 773 EP - 776 ER - TY - CHAP A1 - Seliger, Norbert A1 - Fuerboeck, C. A1 - Habas, P. A1 - Pogany, D. A1 - Gornik, E. T1 - Backside-Laserprober Technique for Characterisation of Semiconductor Power Devices T2 - Proceedings of the Seminar Basics and Technology of Electronic Devices Y1 - 2023 SP - 143 EP - 147 ER - TY - CHAP A1 - Seliger, Norbert A1 - Habas, P. A1 - Koeck, A. A1 - Pogany, D. A1 - Gornik, E. T1 - Backside laserprobing of transient heating in power VDMOSFETs T2 - International Seminar on Power Semiconductors (ISPS) Y1 - 2023 SP - 115 EP - 122 ER - TY - CHAP A1 - Seliger, Norbert A1 - Pogany, D. A1 - Fuerboeck, C. A1 - Habas, P. A1 - Gornik, E. A1 - Stoisiek, M. ED - Grünbacher, H. T1 - A study of temperature distribution in SOI-smart power devices in transient conditions by optical interferometry T2 - 27th European Solid-State Device Research Conference (ESSDERC' 97) Y1 - 2023 UR - https://ieeexplore.ieee.org/document/1503408 SP - 372 EP - 375 ER - TY - JOUR A1 - Seliger, Norbert A1 - Gornik, E. A1 - Pogany, D. A1 - Fuerboeck, C. A1 - Habas, P. A1 - Thalhammer, R. A1 - Stoisiek, M. T1 - Characterisation of Semiconductor Devices by Infrared Laser Interferometry JF - E&I Elektrotechnik und Informationstechnik, Sonderheft Trends in der Mikrotechnik Y1 - 2023 U6 - https://doi.org/10.1007/BF03159611 IS - 7-8 SP - 403 EP - 403 ER - TY - JOUR A1 - Seliger, Norbert A1 - Habas, P. A1 - Pogany, D. A1 - Gornik, E. T1 - Time-Resolved Analysis of Self-Heating in Power VDMOSFETs Using Backside-Laserprobing JF - Solid-State Electronics Y1 - 2023 U6 - https://doi.org/10.1016/S0038-1101(97)00131-7 VL - 41 IS - 9 SP - 1285 EP - 1292 ER - TY - JOUR A1 - Seliger, Norbert A1 - Pogany, D. A1 - Fuerboeck, C. A1 - Habas, P. A1 - Gornik, E. T1 - A laser beam method for evaluation of thermal time constant in smart power devices JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(97)00149-2 VL - 37 IS - 10/11 SP - 1727 EP - 1730 ER -