TY - CHAP A1 - Versen, Martin A1 - Kipfelsberger, S. T1 - Introduction to microcomputer technology with the MSP430 Launch Pad in remote labs T2 - Global Engineering Education Conference (EDUCON), 2014 IEEE N2 - Texas Instruments' MSP430 Launch Pad is used as a key component for remote labs that complement an introduction course to microcomputer technology in the bachelor program Mechatronic at the University of Applied Sciences in Rosenheim. The remote labs use breakout boards and include a timer experiment with generation of pulse width modulation signals, I2C communication and analog to digital conversion. KW - Microelectronics KW - Microcomputer KW - MSP430 Launch Pad Y1 - 2018 ER - TY - CHAP A1 - Versen, Martin A1 - Bernhardt, A1 - Heigl, M. A1 - Viehhauser, P. A1 - Zentgraf, P. T1 - System for real-time data acquisition and processing on a hail-fighter aeroplane T2 - Proceedings of the 5th European DSP Education and Research Conference N2 - The System HAILsens implements a device for Real-Time sensor data processing, running on a Texas Instruments Concerto M3 core. An I2C interface is used for sensor communications. Ethernet with UDP on a custom developed three layered frame organisation of sensor data serves as a link to the main system on board of an aeroplane. For backing up the acquired data, all frames are locally stored on an SD Card. To have the possibility of easily checking the current system status, an LCD module and a push-button provide a minimal user interface. KW - sensors KW - aircraft instrumentation KW - data acquisition KW - liquid crystal displays Y1 - 2018 ER - TY - CHAP A1 - Versen, Martin T1 - DRAM Failure Analysis and Defect Localization Techniques, Microelectronics Failure Analysis T2 - Desk Reference Sixth Edition N2 - Comprehensive guide to the process and test methods used for electronic device failure analysis. Contains dozens of articles—contributed by industry experts—covering a wide range of topics involving the failure analysis of microelectronics. It places the most important and up-to-date information on this subject at your fingertips.  Topic coverage includes:  Failure Analysis Process Flow Failure Verification  Failure Modes and Failure Classification  Special Devices (MEMS, Optoelectronics, Passives)  Fault Localization Techniques: Package Level (NDT)  Die Level (Depackaging, Photon Emission, Microthermography, Laser-Based Methods, Particle Beam Methods)  Deprocessing & Imaging Techniques: Deprocessing  General Imaging Techniques  Local Deprocessing & Imaging  Circuit Edit and Design Modification  Material Analysis Techniques  Reference Information: Important Topics for Semiconductor Devices  Failure Analysis Techniques Roadmap  Failure Analysis Operations and Management  Appendices: Failure Analysis Terms, Definitions, and Acronyms  Industry Standards KW - Microelectronics KW - DRAM Failure Analysis Y1 - 2018 PB - ASM International CY - Ohio ER - TY - CHAP A1 - Versen, Martin A1 - Shankar, S. A1 - Enimidisetty, S. A1 - Bernhardt, A. A1 - Srinivasan, B. T1 - Setup for Locating PV-Cell Surface Defects Through ISC Measurements T2 - Proceedings of the 37th ISTFA 2011 KW - Photovoltaik KW - PV-Cell defects KW - ISC Measurements Y1 - 2018 ER - TY - CHAP A1 - Versen, Martin T1 - Worst Case Test Conditions for Defect Localization in DRAM Devices T2 - Microelectronics Seminar of the ISTFA 2011 KW - DRAM Devices KW - Microelectronics Y1 - 2018 ER - TY - CHAP A1 - Versen, Martin A1 - Treichl, R. A1 - Kaltenecker, M. A1 - El Shahawy, H. A1 - Thomas, T. T. T1 - Differentielle LVDS Schnittstelle für modellbasierte Entwürfe mit MathWorks HDL Coder T2 - 15. AALE Konferenz zu Cyberphysischen Produktionssystemen, 2018 KW - LVDS Schnittstellen KW - MathWorks HDL Coder KW - Cyberphysische Produktionssysteme Y1 - 2018 SN - 978-3-8007-4522-7 PB - VDE-Verlag CY - Berlin ER - TY - JOUR A1 - Versen, Martin A1 - Ernst, W. A1 - Gulati, P. T1 - A row hammer pattern analysis of DDR2 SDRAM JF - Microelectronics Reliability N2 - A DDR2 SDRAM test setup implemented on the Griffin III ATE test system from HILEVEL Technologies is used to analyse the row hammer bug. Row hammer pattern experiments are compared to standard retention tests. The analysis confirms that the row hammer effect is caused by a charge excitation process depending on the number of stress activation cycles. The stress has to occur in the local neighborhood of the cells under test. Shallow impurity levels support the responsible charge carrier transport process in the used DDR2 SDRAM technology KW - Microelectronics KW - pattern analysis Y1 - 2018 UR - https://doi.org/10.1016/j.microrel.2017.07.022 VL - 76-77 SP - 64 EP - 67 ER - TY - CHAP A1 - Versen, Martin A1 - Kipfelsberger, F. A1 - Soekmen, F. T1 - Model-Based Reference Design Projects with MathWorks' HDL Workflow Advisor for Custom-Specific Electronics with the Zedboard T2 - ANALOG 2016; 15. ITG/GMM-Symposium, Bremen, Germany N2 - Reference design projects are implemented to the Xilinx Zynq on the Zedboard which is extended by user defined electronic hardware connected through the Zedboard's FMC (FPGA Mezzanine Card) connector. The implementation method with HDL Workflow Advisor includes constraint definitions for modified reference design projects for use with digital input and outputs and Zynq's XADC (Analog-Digital converter) which is characterized and compared to its data sheet. The bandwidth of the Zynq's internal AXI (Advanced eXtensible Interface) bus connected to the Simulink host PC is determined. KW - Zedboard KW - MathWorks' HDL KW - Custom specific electronics Y1 - 2018 ER - TY - JOUR A1 - Versen, Martin A1 - Ernst, W. A1 - Gulati, P. A1 - Singh, G. T1 - Test setup for reliability studies of DDR2 SDRAM JF - Microelectronics Reliability N2 - A DDR2 DRAM test setup is developed and implemented on the Griffin III ATE test system from HILEVEL Technologies. The test system provides a raw platform for performing various mixed signal and digital tests. In order to configure patterns easily in a vector format, a software platform is developed to manage test patterns according to the user's analysis needs. As examples, retention test patterns with disabled self-refresh are applied to 2 Gbit DDR2 SDRAM of two different DRAM vendors. The devices are characterized in respect to their intrinsic leakage and data retention behavior under the influence of stress conditions such as temperature or access algorithm. The tests are automated and test data is logged for an off-line data analysis. Data is recorded before and after solder simulation steps in order to observe a retention time degradation. KW - Microelectronics KW - DRAM retention solder simulation Y1 - 2018 ER - TY - CHAP A1 - Versen, Martin A1 - Hayn, M. T1 - Introduction to Verification and Test Using a 4-Bit Arithmetic Logic Unit Including a Failure Module in a Xilinx XC9572XL CPLD T2 - Proceedings of the 40th ISTFA 2014 KW - Microelectronics KW - Xilinx XC9572XL CPLD Y1 - 2018 ER - TY - CHAP A1 - Versen, Martin A1 - Kipfelsberger, Stefan A1 - Bernhardt, Andreas T1 - Einführung in die Aufbau- und Verbindungstechnik durch eine interaktive und praxisnahe Qualifizierung in der Leiterplattentechnik T2 - Tagungsband 2. Symposium Elektronik und Systemintegration ESI 2020: "Intelligente Systeme und ihre Komponenten: Forschung und industrielle Anwendung" N2 - Für eine Einführung in die fertigungstechnischen Grundlagen der Aufbau- und Verbindungstechnik sind im Wahlfach „Leiterplattentechnik Praktikum“ an der Technischen Hochschule (TH) Rosenheim Inhalte der Prozesstechnik und des Leiterplattendesigns miteinander kombiniert. Zu Beginn der Veranstaltung zeichnen die Praktikumsteilnehmer ein Layout für eine Leiterbahn-Teststruktur, welche anschließend im Haus gefertigt wird. Nach der Fertigung folgt eine elektrische und optische Charakterisierung zur Kontrolle der Prozessqualität. Die praxisnahe Erstellung eines einlagigen Layouts für eine LED-Taschenlampe auf Basis eines vorgegebenen Schaltplans und innerhalb einer begrenzten Platinenfläche sowie dessen Fertigung befähigen die Kursteilnehmer später, eigene Layouts für elektronische Schaltungen selbstständig zu entwickeln. Die anspruchsvolle, teilautomatische Bestückung einer zweilagigen, vorgegebenen SMT(Surface Mount Technology)-Leiterplatte, die ein FM-Radio mit Capacitive Touch-Steuerung bildet, rundet die erfolgreiche Qualifizierung in der Leiterplattentechnik ab. KW - Leiterplattentechnik Y1 - 2020 UR - https://opus4.kobv.de/opus4-haw-landshut/frontdoor/index/index/docId/212 SN - 978-3-9818439-4-1 SP - 54 EP - 62 CY - Landshut ER - TY - CHAP A1 - Wohlschläger, Maximilian A1 - Holst, Gerhard A1 - Versen, Martin T1 - Automatische Erkennung von Kunststoffen durch bildgebende Fluoreszenzabklingzeitmessung T2 - Tagungsband: AALE 2020 - Automatisierung und Mensch-Technik-Interaktion 17. Fachkonferenz KW - Erkennung von Kunststoffen KW - Fluoreszenzabklingzeitmessung Y1 - 2020 SN - 978-3-8007-5180-8 SP - 223 EP - 231 PB - VDE Verlag Berlin ER - TY - CHAP A1 - Heitauer, Mathias A1 - Versen, Martin T1 - Co-Simulation eines zweistufigen Operationsverstärkers mit MATLAB/Simulink und Cadence ADE T2 - Tagungsband: AALE 2020 - Automatisierung und Mensch-Technik-Interaktion 17. Fachkonferenz N2 - Ein zweistufiger Operationsverstärker wird parallel in einer 180nm CMOS Technologie in der Entwicklungsumgebung von Cadence ADE und in MATLAB/Simulink in einem modellbasierten Ansatz entworfen und simuliert. Für den Entwurf in MATLAB/Simulink wird das Kleinsignalersatzschaltbild der physikalischen Schaltung verwendet. Mit Hilfe der Co-Simulation zwischen Cadence und MATLAB/Simulink wird das Verhalten simuliert und ausgewertet. Die Ergebnisse aus beiden Modellen stimmen überein, wodurch festgestellt werden kann, dass die Co-Simulation erfolgreich war. KW - Co-Simulation KW - Operationsverstärker Y1 - 2020 SN - 978-3-8007-5180-8 SP - 287 EP - 291 PB - VDE Verlag Berlin CY - Berlin ER - TY - CHAP A1 - Wohlschläger, Maximilian A1 - Holst, G. A1 - Versen, Martin T1 - A novel approach to optically distinguish plastics based on fluorescence lifetime measurements T2 - 2020 IEEE Sensors Applications Symposium (SAS), Kuala Lumpur, Malaysia KW - fluorescence Y1 - 2020 SP - 1 EP - 6 ER - TY - JOUR A1 - Wohlschläger, Maximilian A1 - Versen, Martin T1 - Detection of plastics in water based on their fluorescence behavior JF - Journal of Sensors and Sensor Systems N2 - Plastic waste is one of the biggest growing factors contributing to environmental pollution. So far there has been no established method to detect and identify plastics in environmental matrices. Thus, a method based on their characteristic fluorescence behavior is used to investigate whether plastics can be detected and identified in tap water under laboratory conditions. The experiments show that the identification of plastics as a function of water depth is possible. As the identification becomes more difficult with higher water depths, investigations with a highly sensitive imaging method were carried out to obtain an areal integration of the fluorescent light and thus better results. KW - identification of plastics Y1 - 2020 UR - https://doi.org/10.5194/jsss-9-337-2020 VL - 9 IS - 2 SP - 337 EP - 343 ER - TY - JOUR A1 - Versen, Martin A1 - Ernst, W. T1 - Row hammer avoidance analysis of DDR3 SDRAM JF - Microelectronics Reliability N2 - A DDR3 SDRAM test setup implemented on the Griffin III test system from HILEVEL Technologies is used to analyse the row hammer bug. Row hammer pattern experiments are compared to standard retention tests for different manufacturing technologies. The row hammer effect is depending on the number of stress activation cycles. The analysis is extended to an avoidance scheme with refreshes similar to the Target Row Refresh scheme for the DDR4 SDRAM technology. KW - DDR4 SDRAM technology Y1 - 2020 UR - https://doi.org/10.1016/j.microrel.2020.113744 SP - 113744 ER - TY - CHAP A1 - Leiter, Nina A1 - Wohlschläger, Maximilian A1 - Auer, Veronika A1 - Versen, Martin A1 - Laforsch, Christian T1 - A Novel Approach to Identify Wood Species Optically using Fluorescence Lifetime Imaging Microscopy T2 - SMSI 2021 Conference – Sensor and Measurement Science International N2 - This contribution presents the results obtained with fluorescence lifetime imaging microscopy (FLIM)within the optical identification and differentiation of the four wood species walnut, beech, spruce, and maple. The experimental setup as well as the evaluation algorithm, with which the experiments were carried out, is explained briefly. KW - fluorescence lifetime KW - wood species identification KW - fluorescence KW - wood KW - FLIM Y1 - 2021 UR - https://doi.org/10.5162/SMSI2021/B10.2 SP - 169 EP - 170 ER - TY - CHAP A1 - Seehuber, S. A1 - Crämer, P. A1 - Kipfelsberger, S. A1 - Versen, Martin T1 - EtherCAT Gateway für eine Arduino basierte Luftqualitäts-Messung zur Visualisierung an eine Beckhoff SPS T2 - Tagungsband 3. Symposium Elektronik und Systemintegration ESI KW - EtherCAT Gateway KW - Beckhoff SPS Y1 - 2022 U6 - https://doi.org/10.57688/366 SP - 98 EP - 106 ER - TY - CHAP A1 - Bernöcker, Anton A1 - Leiter, Nina A1 - Wohlschläger, Maximilian A1 - Versen, Martin T1 - Entwicklung eines neuronalen Netzwerks als Basis zur automatisierten Holzartenerkennung T2 - Tagungsband AALE 2022, 18. AALE-Konferenz. Pforzheim, 09.03.-11.03.2022 N2 - Holz ist ein vielseitig einsetzbarer nachwachsender Rohstoff. Neben seinem wirtschaftlichen Nutzen ist er für den Erhalt des Klimas unersetzlich. Eine sortenreine Sortierung für die Weiterverarbeitung von Altholz spielt für einen ressourcenschonenden Umgang eine wichtige Rolle. Um das Potenzial eines neuronalen Netzwerks basierend auf Messdaten der bildgebenden Fluoreszenzabklingzeitmessung für die Altholzsortierung aufzuzeigen, wurden zwei unterschiedliche Klassifikationsansätze auf Basis der Programmiersprache Python gewählt. Die Ergebnisse zeigen, dass die bildbasierte Klassifizierung der Holzart mit einer Genauigkeit von 47,36 % noch ausbaufähig ist. Eine datenbasierte Klassifizierung der Holzart mit einer Identifikationsgenauigkeit von 98,28 % ist dagegen vielversprechend. KW - FD-FLIM KW - Fluoreszenz KW - Fluoreszenzabklingzeit KW - Holzart KW - Neuronales Netz KW - Klassifizierung Y1 - 2022 U6 - https://doi.org/https://doi.org/10.33968/2022.11 SP - 115 EP - 124 ER - TY - CHAP A1 - Leiter, Nina A1 - Wohlschläger, Maximilian A1 - Auer, Veronika A1 - Versen, Martin A1 - Laforsch, Christian T1 - An algorithmic method to identify multiple wood species in a single image by their specific fluorescence lifetimes T2 - OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP) N2 - Fluorescence lifetime imaging microscopy (FLIM) combined with an image processing algorithm is successfully used for the optical identification and areal separation of three wood species of maple, larch and nut in a single taken image. KW - Confocal laser scanning microscopy KW - Fluorescence lifetime imaging KW - Image processing KW - Image processing algorithms KW - Phase shift KW - Ultraviolet radiation Y1 - 2021 U6 - https://doi.org/10.1364/COSI.2021.CF2B.3 SP - CF2B.3 ER - TY - CHAP A1 - Wohlschläger, Maximilian A1 - Holst, Gerhard A1 - Versen, Martin A1 - Laforsch, Christian T1 - An optical method to differentiate wood from polymers using fluorescence lifetime imaging microscopy T2 - OSA Optical Sensors and Sensing Congress 2021 (AIS, FTS, HISE, SENSORS, ES) N2 - In this contribution investigations with fluorescence lifetime imaging microscopy (FLIM) are made to optically distinguish polymers and wood. The results show that the distinction and identification is possible in a graphical and calculative way. KW - Diode lasers KW - Fluorescence lifetime imaging KW - Image processing algorithms KW - Phase shift KW - Raman spectroscopy KW - Stray light Y1 - 2021 U6 - https://doi.org/10.1364/ES.2021.EW4G.6 SP - EW4G.6 ER - TY - CHAP A1 - Wohlschläger, Maximilian A1 - Versen, Martin A1 - Laforsch, Christian T1 - Optical identification of car tire particles on soil using fluorescence lifetime imaging microscopy T2 - Optical Sensors and Sensing Congress 2022 (AIS, LACSEA, Sensors, ES), Technical Digest Series (Optica Publishing Group, 2022) N2 - Tire wear is one of the major contributors of environmental pollution by microplastic. FD-FLIM in combination with an image processing algorithm are successfully applied to detect tyre wear on soil. KW - Diode lasers KW - Fluorescence lifetime imaging KW - Image processing KW - Image processing algorithms KW - Phase modulation KW - Phase shift Y1 - 2022 U6 - https://doi.org/10.1364/ES.2022.ETu3H.3 SP - ETu3H.3 ER -