TY - JOUR A1 - Seliger, Norbert A1 - Habas, P. A1 - Pogany, D. A1 - Gornik, E. T1 - Time-Resolved Analysis of Self-Heating in Power VDMOSFETs Using Backside-Laserprobing JF - Solid-State Electronics Y1 - 2023 U6 - https://doi.org/10.1016/S0038-1101(97)00131-7 VL - 41 IS - 9 SP - 1285 EP - 1292 ER - TY - JOUR A1 - Fuerboeck, C. A1 - Seliger, Norbert A1 - Pogany, D. A1 - Litzenberger, M. A1 - Gornik, E. A1 - Stecher, M. A1 - Gosser, H. A1 - Werner, W. T1 - Backside laserprober characterization of thermal effects during high current stress in smart power ESD protection devices JF - International Electron Devices Meeting (IEDM ’98) Technical Digest Y1 - 2023 U6 - https://doi.org/10.1109/IEDM.1998.746451 SP - 691 EP - 694 ER - TY - JOUR A1 - Pogany, D. A1 - Seliger, Norbert A1 - Gornik, E. A1 - Stoisiek, M. A1 - Lalinsky, T. T1 - Analysis of the temperature evolution from the time resolved thermo-optical interferometric measurements with few Fabry-Perot peaks JF - Journal of Applied Physics Y1 - 2023 U6 - https://doi.org/10.1063/1.368674 VL - 84 IS - 8 SP - 4495 EP - 4501 ER - TY - CHAP A1 - Seliger, Norbert A1 - Habas, P. A1 - Gornik, E. ED - de Graaf, H. C. ED - van Kranenburg, H. T1 - Modeling and measurements of backside laserprobe signals in MOSFETs T2 - European Conference on Solid-State Device Research (ESSDERC' 95) Y1 - 2023 UR - https://ieeexplore.ieee.org/document/5436126 SP - 773 EP - 776 ER - TY - CHAP A1 - Pogany, D. A1 - Lalinsky, T. A1 - Seliger, Norbert A1 - Kuzmik, J. A1 - Habas, P. A1 - Hrkut, P. A1 - Gornik, E. T1 - Power Sensor Microsystems Characterization using a contactless optical laser method T2 - International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM' 96) Y1 - 2023 SP - 201 EP - 204 ER - TY - CHAP A1 - Pogany, D. A1 - Seliger, Norbert A1 - Lalinsky, T. A1 - Kuzmik, J. A1 - Habas, P. A1 - Hrkut, P. A1 - Gornik, E. T1 - Study of thermal effects in GaAs micromachined power sensor microsystems by an optical interferometer technique T2 - International Workshop on Thermal Investigation of ICs and Systems (THERMINIC' 96) Y1 - 2023 SP - 185 EP - 190 ER - TY - CHAP A1 - Seliger, Norbert A1 - Habas, P. A1 - Gornik, E. ED - Baccarani, G. ED - Rudan, M. T1 - Time Domain Characterization of lattice heating in power VDMOSFETs by means of an interferometric laserprobe technique T2 - Proceedings of the 26th European Solid State Device Research Conference (ESSDERC' 96) Y1 - 2023 UR - https://ieeexplore.ieee.org/document/5435968 SP - 847 EP - 850 ER - TY - CHAP A1 - Seliger, Norbert A1 - Habas, P. A1 - Koeck, A. A1 - Pogany, D. A1 - Gornik, E. T1 - Backside laserprobing of transient heating in power VDMOSFETs T2 - International Seminar on Power Semiconductors (ISPS) Y1 - 2023 SP - 115 EP - 122 ER - TY - CHAP A1 - Fürböck, C. A1 - Thalhammer, R. A1 - Litzenberger, M. A1 - Seliger, Norbert A1 - Pogany, D. A1 - Gornik, E. A1 - Wachutka, G. T1 - Internal Characterisation of IGBTs Using the Backside Laserprober Technique T2 - Jahrestagung der GMe, Bad Hofgastein Tagungsband 1999 KW - IGBT Y1 - 1999 SN - 3-901678-04-8 PB - Gesellschaft für Mikroelektronik (GMe) ER - TY - JOUR A1 - Fürböck, C. A1 - Litzenberger, M. A1 - Pogany, D. A1 - Gornik, E. A1 - Seliger, Norbert A1 - Müller-Lynch, T. A1 - Stecher, M. A1 - Goßner, H. A1 - Werner, W. T1 - Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(99)00124-9 SN - 0026-2714 VL - 39 IS - 6 SP - 925 EP - 930 ER - TY - JOUR A1 - Pogany, D. A1 - Seliger, Norbert A1 - Litzenberger, M. A1 - Gossner, H. A1 - Stecher, M. A1 - Müller-Lynch, T. A1 - Werner, W. A1 - Gornik, E. T1 - Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(99)00162-6 SN - 0026-2714 VL - 39 IS - 6 SP - 1143 EP - 1148 ER - TY - CHAP A1 - Fürböck, C. A1 - Thalhammer, R. A1 - Litzenberger, M. A1 - Seliger, Norbert A1 - Pogany, D. A1 - Gornik, E. A1 - Wachutka, G. T1 - A differential backside laserprobing technique for the investigation of the lateral temperature distribution in power devices T2 - 11th International Symposium on Power Semiconductor Devices and ICs. ISPSD’99 Proceedings KW - backside laserprobing Y1 - 2023 U6 - https://doi.org/10.1109/ISPSD.1999.764095 SP - 193 EP - 196 PB - IEEE ER - TY - CHAP A1 - Fürböck, C. A1 - Pogany, D. A1 - Litzenberger, M. A1 - Gornik, E. A1 - Seliger, Norbert A1 - Gossner, H. A1 - Müller-Lynch, T. A1 - Stecher, M. A1 - Werner, W. T1 - Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices T2 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings KW - ESD KW - smart power device Y1 - 2023 U6 - https://doi.org/10.1109/EOSESD.1999.819067 SP - 241 EP - 250 PB - IEEE ER - TY - JOUR A1 - Fürböck, C. A1 - Pogany, D. A1 - Litzenberger, M. A1 - Gornik, E. A1 - Seliger, Norbert A1 - Gossner, H. A1 - Müller-Lynch, T. A1 - Stecher, M. A1 - Werner, W. T1 - Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices JF - Journal of Electrostatics KW - ESD KW - smart power device Y1 - 2023 VL - 49 SP - 195 EP - 213 ER -