TY - JOUR A1 - Seliger, Norbert A1 - Gornik, E. A1 - Pogany, D. A1 - Fuerboeck, C. A1 - Habas, P. A1 - Thalhammer, R. A1 - Stoisiek, M. T1 - Characterisation of Semiconductor Devices by Infrared Laser Interferometry JF - E&I Elektrotechnik und Informationstechnik, Sonderheft Trends in der Mikrotechnik Y1 - 2023 U6 - https://doi.org/10.1007/BF03159611 IS - 7-8 SP - 403 EP - 403 ER - TY - JOUR A1 - Pogany, D. A1 - Seliger, Norbert A1 - Lalinsky, T. A1 - Kuzmik, J. A1 - Habas, P. A1 - Hrkut, P. A1 - Gornik, E. T1 - Study of Thermal Effects in GaAs Micromachined Power Sensor Microsystems by an Optical Interferometer Technique JF - Microelectronics Journal Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2692(97)00057-8 VL - 29 IS - 4-5 SP - 191 EP - 198 ER - TY - JOUR A1 - Fuerboeck, C. A1 - Seliger, Norbert A1 - Pogany, D. A1 - Litzenberger, M. A1 - Gornik, E. A1 - Stecher, M. A1 - Gosser, H. A1 - Werner, W. T1 - Backside laserprober characterization of thermal effects during high current stress in smart power ESD protection devices JF - International Electron Devices Meeting (IEDM ’98) Technical Digest Y1 - 2023 U6 - https://doi.org/10.1109/IEDM.1998.746451 SP - 691 EP - 694 ER - TY - JOUR A1 - Pogany, D. A1 - Seliger, Norbert A1 - Gornik, E. A1 - Stoisiek, M. A1 - Lalinsky, T. T1 - Analysis of the temperature evolution from the time resolved thermo-optical interferometric measurements with few Fabry-Perot peaks JF - Journal of Applied Physics Y1 - 2023 U6 - https://doi.org/10.1063/1.368674 VL - 84 IS - 8 SP - 4495 EP - 4501 ER -