TY - JOUR A1 - Kanert, W. A1 - Dettmer, H. A1 - Plikat, B. A1 - Seliger, Norbert T1 - Reliability aspects of semiconductor devices in high temperature applications JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(03)00313-5 SN - 0026-2714 VL - 43 IS - 9 SP - 1839 EP - 1846 ER -