TY - CHAP A1 - Versen, Martin T1 - DRAM Failure Analysis and Defect Localization Techniques, Microelectronics Failure Analysis T2 - Desk Reference Sixth Edition N2 - Comprehensive guide to the process and test methods used for electronic device failure analysis. Contains dozens of articles—contributed by industry experts—covering a wide range of topics involving the failure analysis of microelectronics. It places the most important and up-to-date information on this subject at your fingertips.  Topic coverage includes:  Failure Analysis Process Flow Failure Verification  Failure Modes and Failure Classification  Special Devices (MEMS, Optoelectronics, Passives)  Fault Localization Techniques: Package Level (NDT)  Die Level (Depackaging, Photon Emission, Microthermography, Laser-Based Methods, Particle Beam Methods)  Deprocessing & Imaging Techniques: Deprocessing  General Imaging Techniques  Local Deprocessing & Imaging  Circuit Edit and Design Modification  Material Analysis Techniques  Reference Information: Important Topics for Semiconductor Devices  Failure Analysis Techniques Roadmap  Failure Analysis Operations and Management  Appendices: Failure Analysis Terms, Definitions, and Acronyms  Industry Standards KW - Microelectronics KW - DRAM Failure Analysis Y1 - 2018 PB - ASM International CY - Ohio ER - TY - CHAP A1 - Versen, Martin T1 - Worst Case Test Conditions for Defect Localization in DRAM Devices T2 - Microelectronics Seminar of the ISTFA 2011 KW - DRAM Devices KW - Microelectronics Y1 - 2018 ER - TY - CHAP A1 - Versen, Martin A1 - Shankar, S. A1 - Enimidisetty, S. A1 - Bernhardt, A. A1 - Srinivasan, B. T1 - Setup for Locating PV-Cell Surface Defects Through ISC Measurements T2 - Proceedings of the 37th ISTFA 2011 KW - Photovoltaik KW - PV-Cell defects KW - ISC Measurements Y1 - 2018 ER - TY - CHAP A1 - Weidner, Karl A1 - Kaspar, Michael A1 - Seliger, Norbert T1 - Innovative Leistungsmodule T2 - Produktion von Leiterplatten und Systemen (PLUS) KW - Leistungsmodule Y1 - 2011 SP - 1408 EP - 1412 ER - TY - JOUR A1 - Wirth, Heike A1 - Schutter, Sabina T1 - Versorger und Verlierer JF - DJI Impuls N2 - Das traditionelle Ernährermodell wird seltener. Vor allem junge Frauen arbeiten genausoviel wie ihre Partner. Doch sind Kinder da, steigen die Mütter ganz oder teilweise aus dem Erwerbsleben aus – mit erheblichen Risiken für ihre Alterssicherung. KW - Familie KW - Arbeit Y1 - 2011 VL - 2011 IS - 01 SP - 28 EP - 30 ER -