TY - CHAP A1 - Yilmaz, Tugce A1 - Mari, Jorge A1 - Asam, Johann A1 - Kirner, Michael A1 - List, Andreas A1 - Fantauzzo, Lucia A1 - Seliger, Norbert T1 - AC Cycling Testing of SiC MOSFET Power Module T2 - Proccedings International exhibition and conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management (PCIM 2025) N2 - This paper details the development of an accelerated AC cycling test bench for evaluating the aging mechanisms of SiC MOSFET power modules. Contrary to classical HTGS and DGS which only exercise gate source stresses the AC Cycler switched under high voltage and current. Operating for about 235 hours, the system maintained stable thermal conditions thanks to an integrated cooling system. Key precursors of aging, such as increases in threshold voltage and on-state resistance were identified using static characterization curve tracer before and after the test. Gate charge and Vdson were also measured on-line with specially developed gate drivers. KW - power module KW - SiC KW - power cycling testing KW - MOSFET Y1 - 2025 SN - 978-3-8007-6541-6 U6 - https://doi.org/10.30420/566541341 SP - 2562 EP - 2567 PB - VDE VERLAG GMBH CY - Berlin ER - TY - CHAP A1 - Gerber, M. A1 - Ferreira, J.A. A1 - Seliger, Norbert A1 - Hofsajer, I.W. T1 - Design and evaluation of an automotive integrated system module T2 - Conference Record of the 2005 Industry Applications Conference KW - power module Y1 - 2023 SP - 1144 EP - 1151 PB - IEEE ER -