TY - JOUR A1 - Castellazzi, A. A1 - Kraus, R. A1 - Seliger, Norbert A1 - Schmitt-Landsiedel, D. T1 - Reliability analysis of power MOSFET’s with the help of compact models and circuit simulation JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(02)00198-1 SN - 0026-2714 VL - 42 IS - 9 SP - 1605 EP - 1610 ER - TY - JOUR A1 - Castellazzi, A. A1 - Kartal, V. A1 - Kraus, R. A1 - Seliger, Norbert A1 - Honsberg-Riedl, M. A1 - Schmitt-Landsiedel, D. T1 - Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET’s JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(03)00319-6 SN - 0026-2714 VL - 43 IS - 9 SP - 1877 EP - 1882 ER -