TY - CHAP A1 - Röhrich, A. A1 - Hirsch, H. A1 - Seliger, Norbert T1 - EMC-optimised design of a converter power stage by reduction of surface currents T2 - IEEE 35th Annual Power Electronics Specialists Conference (IEEE Cat. No.04CH37551) KW - EMC Y1 - 2023 SP - 82 EP - 85 PB - IEEE ER - TY - CHAP A1 - Gerber, M. A1 - Ferreira, J.A. A1 - Hofsajer, I.W. A1 - Seliger, Norbert T1 - Interleaving optimization in synchronous rectified DC/DC converters T2 - IEEE 35th Annual Power Electronics Specialists Conference (IEEE Cat. No.04CH37551) KW - DC/DC converter Y1 - 2023 SP - 4655 EP - 4661 PB - IEEE ER - TY - CHAP A1 - Gerber, M. A1 - Ferreira, J.A. A1 - Hofsajer, I.W. A1 - Seliger, Norbert T1 - Integral design of a high power density DC/DC converter for harsh environments T2 - European Conference on Power Electronics and Applications KW - DC/DC converter Y1 - 2023 PB - IEEE ER - TY - JOUR A1 - Gerber, M. A1 - Ferreira, J.A. A1 - Seliger, Norbert A1 - Hofsajer, I.W. T1 - High density packaging of the passive components in an automotive DC/DC converter JF - IEEE Transactions on Power Electronics KW - DC/DC converter Y1 - 2023 VL - 20 IS - 2 SP - 268 EP - 275 PB - IEEE ER - TY - CHAP A1 - Gerber, M. A1 - Ferreira, J.A. A1 - Seliger, Norbert A1 - Hofsajer, I.W. T1 - Design and evaluation of an automotive integrated system module T2 - Conference Record of the 2005 Industry Applications Conference KW - power module Y1 - 2023 SP - 1144 EP - 1151 PB - IEEE ER - TY - CHAP A1 - Renken, F. A1 - Ehbauer, G. A1 - Karrer, V. A1 - Knorr, R. A1 - Ramminger, S. A1 - Seliger, Norbert A1 - Wolfgang, E. T1 - Reliability of high temperature inverters for HEV T2 - Proceedings Power Conversion Conference KW - HEV KW - Reliability KW - High-Temperature Electronics Y1 - 2023 U6 - https://doi.org/10.1109/PCCON.2007.373022 SP - 563 EP - 568 PB - IEEE CY - Nagoya ER - TY - JOUR A1 - Gerber, M. A1 - Ferreira, J.A. A1 - Seliger, Norbert A1 - Hofsajer, I.W. T1 - Integral 3-D thermal, electrical and mechanical design of an automotive DC/DC converter JF - IEEE Transactions on Power Electronics KW - DC/DC converter Y1 - 2023 VL - 20 IS - 3 SP - 566 EP - 575 PB - IEEE ER - TY - JOUR A1 - Fürböck, C. A1 - Pogany, D. A1 - Litzenberger, M. A1 - Gornik, E. A1 - Seliger, Norbert A1 - Gossner, H. A1 - Müller-Lynch, T. A1 - Stecher, M. A1 - Werner, W. T1 - Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices JF - Journal of Electrostatics KW - ESD KW - smart power device Y1 - 2023 VL - 49 SP - 195 EP - 213 ER - TY - CHAP A1 - Gerstenmaier, Y.C. A1 - Wachutka, G. A1 - Seliger, Norbert T1 - Efficient calculation of transient temperature fields responding to fast changing heatsources over long duration in high frequency DC/DC converter T2 - Proceedings of THERMINIC KW - DC/DC converter KW - thermal management Y1 - 2023 SP - 297 EP - 302 ER - TY - CHAP A1 - Fürböck, C. A1 - Pogany, D. A1 - Litzenberger, M. A1 - Gornik, E. A1 - Seliger, Norbert A1 - Gossner, H. A1 - Müller-Lynch, T. A1 - Stecher, M. A1 - Werner, W. T1 - Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices T2 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings KW - ESD KW - smart power device Y1 - 2023 U6 - https://doi.org/10.1109/EOSESD.1999.819067 SP - 241 EP - 250 PB - IEEE ER - TY - CHAP A1 - Seliger, Norbert A1 - Ramminger, S. A1 - Franke, T. A1 - Wachutka, G. T1 - A study of heel crack failures in wire bonds under mechanical cycling T2 - Proceedings of Micromat 2000 KW - wire bond KW - reliability KW - heel crack Y1 - 2023 ER - TY - CHAP A1 - Fürböck, C. A1 - Thalhammer, R. A1 - Litzenberger, M. A1 - Seliger, Norbert A1 - Pogany, D. A1 - Gornik, E. A1 - Wachutka, G. T1 - A differential backside laserprobing technique for the investigation of the lateral temperature distribution in power devices T2 - 11th International Symposium on Power Semiconductor Devices and ICs. ISPSD’99 Proceedings KW - backside laserprobing Y1 - 2023 U6 - https://doi.org/10.1109/ISPSD.1999.764095 SP - 193 EP - 196 PB - IEEE ER - TY - JOUR A1 - Seliger, Norbert A1 - Faltlhauser, Georg T1 - Progressive Expansion Sampling of Quasi-Static Magnetic Fields in Unconfined Regions JF - IEEE Transactions on Components, Packaging and Manufacturing Technology N2 - We present a fast and accurate measurement technique for quasi-static magnetic fields by employing a progressive sampling method in an unconfined input space. The proposed machine learning algorithm is tested against uniform sampling on printed circuit board test structures and a buck converter. We prove allocation of multiple, separated regions with predefined lateral field limits at MHz frequencies. The feasibility of equivalent magnetic dipole source modeling based on a small number of samples is demonstrated. Compared to uniform testing, progressive expansion sampling identifies contours of given field limits in less than 3% of the reference measurement time. KW - Progressive Expansion Sampling KW - Near-Field Scanning KW - Machine Learning KW - Gaussian Process Classifier KW - MoM modeling Y1 - 2023 U6 - https://doi.org/10.1109/TCPMT.2023.3283285 ER - TY - CHAP A1 - Oila, K. A1 - Ciappa, M. A1 - Seliger, Norbert A1 - Fichtner, W. T1 - Thermal Modeling, Simulation and Characterization of a High-Temperature Converter for Automotive Applications T2 - Proc. 10th European Conference on Power Electronics and Applications, EPE Y1 - 2023 VL - 10 ER - TY - CHAP A1 - Castellazzi, A. A1 - Kraus, R. A1 - Seliger, Norbert A1 - Schmitt-Landsiedel, D. T1 - Influence of parasitic inductances on the switching behaviour of Power MOSFETs used in automotive applications T2 - Proc. 10th European Conference on Power Electronics and Applications, EPE Y1 - 2023 VL - 10 ER - TY - CHAP A1 - Oila, Kari A1 - Ciappa, Mauro A1 - Seliger, Norbert A1 - Fichtner, Wolfgang T1 - Computer assisted thermal design of an integrated starter generator and model assessment under realistic operating conditions T2 - International Workshop on Thermal Investigation of ICs and Systems (THERMINIC) Y1 - 2023 SN - 978-2-84813-020-0 SP - 107 EP - 112 ER - TY - JOUR A1 - Pogany, D. A1 - Seliger, Norbert A1 - Litzenberger, M. A1 - Gossner, H. A1 - Stecher, M. A1 - Müller-Lynch, T. A1 - Werner, W. A1 - Gornik, E. T1 - Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(99)00162-6 SN - 0026-2714 VL - 39 IS - 6 SP - 1143 EP - 1148 ER - TY - CHAP A1 - Wolfgang, E A1 - Seliger, Norbert A1 - Lugert, G A1 - Riepl, T T1 - High-temperature power electronics: challenges and opportunities T2 - Proceedings of the 2nd International Conference on Integrated Power Systems (CIPS) Y1 - 2023 SP - 43 EP - 51 ER - TY - JOUR A1 - Seliger, Norbert A1 - Wolfgang, E. A1 - Lefranc, G. A1 - Berg, H. A1 - Licht, T. T1 - Reliable power electronics for automotive applications JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(02)00197-X SN - 0026-2714 VL - 42 IS - 9-11 SP - 1597 EP - 1604 ER - TY - JOUR A1 - Fürböck, C. A1 - Litzenberger, M. A1 - Pogany, D. A1 - Gornik, E. A1 - Seliger, Norbert A1 - Müller-Lynch, T. A1 - Stecher, M. A1 - Goßner, H. A1 - Werner, W. T1 - Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(99)00124-9 SN - 0026-2714 VL - 39 IS - 6 SP - 925 EP - 930 ER - TY - JOUR A1 - Ramminger, S. A1 - Seliger, Norbert A1 - Wachutka, G. T1 - Reliability model for Al wire bonds subjected to heel crack failures JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(00)00139-6 SN - 0026-2714 VL - 40 IS - 8 SP - 1521 EP - 1525 ER - TY - JOUR A1 - Castellazzi, A. A1 - Kraus, R. A1 - Seliger, Norbert A1 - Schmitt-Landsiedel, D. T1 - Reliability analysis of power MOSFET’s with the help of compact models and circuit simulation JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(02)00198-1 SN - 0026-2714 VL - 42 IS - 9 SP - 1605 EP - 1610 ER - TY - JOUR A1 - Castellazzi, A. A1 - Kartal, V. A1 - Kraus, R. A1 - Seliger, Norbert A1 - Honsberg-Riedl, M. A1 - Schmitt-Landsiedel, D. T1 - Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET’s JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(03)00319-6 SN - 0026-2714 VL - 43 IS - 9 SP - 1877 EP - 1882 ER - TY - JOUR A1 - Coquery, G. A1 - Lefranc, G. A1 - Licht, T. A1 - Lallemand, R. A1 - Seliger, Norbert A1 - Berg, H. T1 - High temperature reliability on automotive power modules verified by power cycling tests up to 150°C JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(03)00318-4 SN - 0026-2714 VL - 43 IS - 9 SP - 1871 EP - 1876 ER - TY - JOUR A1 - Gerber, M. A1 - Ferreira, J.A. A1 - Hofsajer, I.W. A1 - Seliger, Norbert T1 - A volumetric optimization of a low-pass filter JF - IEEE Transactions on Industry Applications KW - DC-DC power converters KW - Electronic packaging thermal management KW - Industry Applications Society KW - Integrated circuit interconnections KW - Low pass filters KW - Magnetic separation KW - Manufacturing KW - Power electronics KW - Power system interconnection Y1 - 2023 U6 - https://doi.org/10.1109/TIA.2002.802996 SN - 1939-9367 VL - 38 IS - 5 SP - 1432 EP - 1440 ER - TY - JOUR A1 - Kanert, W. A1 - Dettmer, H. A1 - Plikat, B. A1 - Seliger, Norbert T1 - Reliability aspects of semiconductor devices in high temperature applications JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(03)00313-5 SN - 0026-2714 VL - 43 IS - 9 SP - 1839 EP - 1846 ER - TY - CHAP A1 - Gerber, M. A1 - Ferreira, J.A. A1 - Hofsajer, I.W. A1 - Seliger, Norbert T1 - High density packaging of the passive components in an automotive DC/DC converter T2 - 2002 IEEE 33rd Annual IEEE Power Electronics Specialists Conference. Proceedings (Cat. No.02CH37289) KW - Automotive engineering KW - Cooling KW - DC-DC power converters KW - Filters KW - Inductors KW - Packaging KW - Resistance heating KW - Temperature KW - Thermal conductivity KW - Thermal resistance Y1 - 2023 U6 - https://doi.org/10.1109/PSEC.2002.1022545 VL - 2 SP - 761 EP - 767 ER - TY - JOUR A1 - Gerber, M. A1 - Seliger, Norbert A1 - Ferreira, J. A. A1 - Hofsajer, I. W. T1 - Magnetic component miniaturisation for application in power electronic modules JF - 4th International Conference on Integrated Power Systems KW - Windings KW - Heating Y1 - 2023 UR - https://ieeexplore.ieee.org/document/5758070 SP - 1 EP - 6 ER - TY - JOUR A1 - Pogany, D. A1 - Seliger, Norbert A1 - Lalinsky, T. A1 - Kuzmik, J. A1 - Habas, P. A1 - Hrkut, P. A1 - Gornik, E. T1 - Study of Thermal Effects in GaAs Micromachined Power Sensor Microsystems by an Optical Interferometer Technique JF - Microelectronics Journal Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2692(97)00057-8 VL - 29 IS - 4-5 SP - 191 EP - 198 ER - TY - CHAP A1 - Thalhammer, R. A1 - Fuerboeck, C. A1 - Seliger, Norbert A1 - Deboy, G. A1 - Gornik, E. A1 - Wachutka, G. T1 - Internal characterization of IGBTs using the backside laser probing technique - Interpretation of measurement by numerical simulation T2 - Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs (Proc. of ISPSD) Y1 - 2023 U6 - https://doi.org/10.1109/ISPSD.1998.702668 SP - 199 EP - 202 ER - TY - JOUR A1 - Seliger, Norbert A1 - Gornik, E. A1 - Pogany, D. A1 - Fuerboeck, C. A1 - Habas, P. A1 - Thalhammer, R. A1 - Stoisiek, M. T1 - Characterisation of Semiconductor Devices by Infrared Laser Interferometry JF - E&I Elektrotechnik und Informationstechnik, Sonderheft Trends in der Mikrotechnik Y1 - 2023 U6 - https://doi.org/10.1007/BF03159611 IS - 7-8 SP - 403 EP - 403 ER - TY - CHAP A1 - Thalhammer, R. A1 - Fuerboeck, C. A1 - Seliger, Norbert A1 - Gornik, E. A1 - Wachutka, G. T1 - Validation and calibration of Electrothermal Device Models Using Infrared Laser Probing Techniques T2 - Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems (Proc. of MSM’98) Y1 - 2023 UR - https://briefs.techconnect.org/wp-content/volumes/MSM98/pdf/T3205.pdf SP - 213 EP - 217 ER - TY - JOUR A1 - Pogany, D. A1 - Seliger, Norbert A1 - Gornik, E. A1 - Stoisiek, M. A1 - Lalinsky, T. T1 - Analysis of the temperature evolution from the time resolved thermo-optical interferometric measurements with few Fabry-Perot peaks JF - Journal of Applied Physics Y1 - 2023 U6 - https://doi.org/10.1063/1.368674 VL - 84 IS - 8 SP - 4495 EP - 4501 ER - TY - JOUR A1 - Fuerboeck, C. A1 - Seliger, Norbert A1 - Pogany, D. A1 - Litzenberger, M. A1 - Gornik, E. A1 - Stecher, M. A1 - Gosser, H. A1 - Werner, W. T1 - Backside laserprober characterization of thermal effects during high current stress in smart power ESD protection devices JF - International Electron Devices Meeting (IEDM ’98) Technical Digest Y1 - 2023 U6 - https://doi.org/10.1109/IEDM.1998.746451 SP - 691 EP - 694 ER - TY - CHAP A1 - Seliger, Norbert A1 - Fuerboeck, C. A1 - Habas, P. A1 - Pogany, D. A1 - Gornik, E. T1 - Backside-Laserprober Technique for Characterisation of Semiconductor Power Devices T2 - Proceedings of the Seminar Basics and Technology of Electronic Devices Y1 - 2023 SP - 143 EP - 147 ER - TY - JOUR A1 - Seliger, Norbert A1 - Habas, P. A1 - Pogany, D. A1 - Gornik, E. T1 - Time-Resolved Analysis of Self-Heating in Power VDMOSFETs Using Backside-Laserprobing JF - Solid-State Electronics Y1 - 2023 U6 - https://doi.org/10.1016/S0038-1101(97)00131-7 VL - 41 IS - 9 SP - 1285 EP - 1292 ER - TY - CHAP A1 - Pogany, D. A1 - Fuerboeck, C. A1 - Seliger, Norbert A1 - Habas, P. A1 - Gornik, E. A1 - Kubicek, S. A1 - Decoutere, S. ED - Grünbacher, H. T1 - Optical Testing of submicron-technology MOSFETs and bipolar transistors T2 - European Solid-State Device Research Conference (ESSDERC' 97) Y1 - 2023 UR - https://ieeexplore.ieee.org/document/1503373 SP - 372 EP - 375 ER - TY - CHAP A1 - Seliger, Norbert A1 - Pogany, D. A1 - Fuerboeck, C. A1 - Habas, P. A1 - Gornik, E. A1 - Stoisiek, M. ED - Grünbacher, H. T1 - A study of temperature distribution in SOI-smart power devices in transient conditions by optical interferometry T2 - 27th European Solid-State Device Research Conference (ESSDERC' 97) Y1 - 2023 UR - https://ieeexplore.ieee.org/document/1503408 SP - 372 EP - 375 ER - TY - JOUR A1 - Seliger, Norbert A1 - Pogany, D. A1 - Fuerboeck, C. A1 - Habas, P. A1 - Gornik, E. T1 - A laser beam method for evaluation of thermal time constant in smart power devices JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(97)00149-2 VL - 37 IS - 10/11 SP - 1727 EP - 1730 ER - TY - CHAP A1 - Fuerboeck, C. A1 - Thalhammer, R. A1 - Seliger, Norbert A1 - Pogany, D. A1 - Deboy, G. A1 - Wachutka, G. A1 - Gornik, E. T1 - Lokale Temperaturbestimmung in Insulated Gate Bipolar Transistoren (IGBTs) mittels Lasersondentechnik T2 - Beiträge der Informationstagung ME 97 OVE-Schriftenreihe; Nr. 14 (ISBN 3-85133-010-2) Y1 - 2023 UR - https://d-nb.info/960109242/04 VL - 14 SP - 117 EP - 122 ER - TY - CHAP A1 - Seliger, Norbert A1 - Habas, P. A1 - Koeck, A. A1 - Pogany, D. A1 - Gornik, E. T1 - Backside laserprobing of transient heating in power VDMOSFETs T2 - International Seminar on Power Semiconductors (ISPS) Y1 - 2023 SP - 115 EP - 122 ER - TY - JOUR A1 - Seliger, Norbert A1 - Habaš, Predrag A1 - Gornik, Erich T1 - A study of backside laser-probe signals in MOSFETs JF - Microelectronic Engineering Y1 - 2023 U6 - https://doi.org/10.1016/0167-9317(95)00329-0 VL - 31 IS - 1-4 SP - 87 EP - 94 ER - TY - CHAP A1 - Burian, E. A1 - Pogany, D. A1 - Lalinsky, T. A1 - Seliger, Norbert A1 - Gornik, E. T1 - Thermal Simulation and characterization of GaAs micromachined power sensor microsystems T2 - Eurosensors XI Y1 - 2023 SP - 949 EP - 952 ER - TY - CHAP A1 - Seliger, Norbert A1 - Habas, P. A1 - Gornik, E. ED - Baccarani, G. ED - Rudan, M. T1 - Time Domain Characterization of lattice heating in power VDMOSFETs by means of an interferometric laserprobe technique T2 - Proceedings of the 26th European Solid State Device Research Conference (ESSDERC' 96) Y1 - 2023 UR - https://ieeexplore.ieee.org/document/5435968 SP - 847 EP - 850 ER - TY - CHAP A1 - Pogany, D. A1 - Seliger, Norbert A1 - Lalinsky, T. A1 - Kuzmik, J. A1 - Habas, P. A1 - Hrkut, P. A1 - Gornik, E. T1 - Study of thermal effects in GaAs micromachined power sensor microsystems by an optical interferometer technique T2 - International Workshop on Thermal Investigation of ICs and Systems (THERMINIC' 96) Y1 - 2023 SP - 185 EP - 190 ER - TY - CHAP A1 - Seliger, Norbert A1 - Habas, P. A1 - Gornik, E. ED - de Graaf, H. C. ED - van Kranenburg, H. T1 - Modeling and measurements of backside laserprobe signals in MOSFETs T2 - European Conference on Solid-State Device Research (ESSDERC' 95) Y1 - 2023 UR - https://ieeexplore.ieee.org/document/5436126 SP - 773 EP - 776 ER - TY - CHAP A1 - Pogany, D. A1 - Lalinsky, T. A1 - Seliger, Norbert A1 - Kuzmik, J. A1 - Habas, P. A1 - Hrkut, P. A1 - Gornik, E. T1 - Power Sensor Microsystems Characterization using a contactless optical laser method T2 - International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM' 96) Y1 - 2023 SP - 201 EP - 204 ER - TY - CHAP A1 - Seliger, Norbert T1 - A Differential Relaxation Half-Bridge Oscillator for Inductive Power Transfer T2 - Proceedings PCIM Europe 2023 N2 - We present inductive power transfer (IPT) with a half-bridge converter based on differential relaxation self-oscillation. The oscillation dynamics of the converter automatically adapts to variation in the inductive coupling link and changes in the load, respectively. Design equations based on theoretical circuit analysis reveals a high power transfer efficiency (>90%) for alteration of coupling distance in the strong coupling regime. A prototype system employing GaN-HEMTs confirms the theoretically predicted characteristics of the proposed circuit. KW - wireless power transfer, inductive power transfer, half-bridge converter, relaxation oscillator Y1 - 2023 PB - Mesago GmbH CY - Nürnberg ER - TY - CHAP A1 - Seliger, Norbert T1 - A Differential Relaxation Oscillator for Inductive Power Transfer T2 - 2022 IEEE Industrial Electronics and Applications Conference (IEACon) N2 - We present a novel differential relaxation oscillator for inductive power transfer. The proposed oscillator offers an automatic adaption of the oscillation period to a change in the power link impedance, which ensures a high efficient operation for variable loads and coupling factors. A detailed circuit model of the self-oscillation system is provided with analytical design equations. We find a large self-oscillation range for variable coupling factors and loads. The theoretical results are confirmed by circuit simulation and measurements carried out on a low-power demonstrator system. We demonstrate non-resonant and robust self-adaption of the relaxation oscillator to coupling factors ranging from k=0.6-0.9. KW - Relaxation Oscillator KW - Inductive Power Transfer Y1 - 2022 SP - 1 EP - 6 PB - IEEE ER - TY - CHAP A1 - Seliger, Norbert T1 - Self-Oscillating Capacitive Power Transfer with Multiple Receiver Capability and Coupling Path Adaption T2 - Proceedings 24th European Conference on Power Electronics and Applications (EPE’22 ECCE Europe) KW - Capacitive Coupling KW - Half Bridge KW - Wireless power transmission KW - Gallium Nitride (GaN) KW - HEMT KW - Contactless energy transfer KW - High frequency power converter Y1 - 2022 PB - EPE ER -