TY - CHAP A1 - Seliger, Norbert A1 - Helmbrecht, Cordula T1 - A high-frequency performance and degradation study of adhesive conductive EMI shielding tapes during High-Temperature Storage T2 - Proccedings CIPS 2024 - 13th International Conference on Integrated Power Electronics Systems N2 - The variation of the contact impedance of adhesive conductive EMI shielding tapes under high temperature storage (HTS) of 110degC is investigated. The adhesive tapes under test are implemented as signal return paths in microstrip lines. Changes in the ground plane impedance by adhesive deterioration are analyzed by S-parameter measurements from 1MHz to 3GHz. A circuit model for contact impedance degradation is proposed and applied in simulation of board level shielding. Contact resistance and contact capacitance are found to increase significantly after 2400h, causing a declined magnetic field shielding effectiveness by 30 dB below 500 MHz. KW - EMI KW - Shielding tape KW - High-Temperature Storage KW - adhesive conductive EMI shielding tape Y1 - 2024 SN - 978-3-8007-6288-0 SN - 0341-3934 SP - 297 EP - 303 PB - VDE VERLAG GMBH CY - Düsseldorf ER - TY - CHAP A1 - Seliger, Norbert A1 - Faltlhauser, Georg T1 - Progressive Expansion Sampling of Quasi-Static Magnetic Fields for EMI Noise Detection and Equivalent Source Modeling T2 - Proceedings EMC Europe 2023 N2 - We introduce a quick and accurate quasi-static magnetic field scanning technique by employing a progressive sampling method in an unconfined input space. The proposed machine learning algorithm is tested against uniform sampling on a printed circuit board test structure. We prove allocation of multiple, separated regions with predefined tangential field strengths at MHz frequencies. The feasibility of equivalent magnetic dipole source modeling based on a small number of samples is demonstrated. Compared to uniform testing, progressive expansion sampling detects contours of given field limits in less than 3% of the reference measurement time. KW - magnetic near field KW - Gaussian process classifier KW - EMI Y1 - 2023 PB - IEEE CY - Krakov ER -