TY - JOUR A1 - Gerber, M. A1 - Ferreira, J.A. A1 - Hofsajer, I.W. A1 - Seliger, Norbert T1 - A high-density heat-sink-mounted inductor for automotive applications JF - IEEE Transactions on Industry Applications KW - inductor Y1 - 2023 VL - 40 IS - 4 SP - 1031 EP - 1038 PB - IEEE ER - TY - JOUR A1 - Gerber, M. A1 - Ferreira, J.A. A1 - Seliger, Norbert A1 - Hofsajer, I.W. T1 - High density packaging of the passive components in an automotive DC/DC converter JF - IEEE Transactions on Power Electronics KW - DC/DC converter Y1 - 2023 VL - 20 IS - 2 SP - 268 EP - 275 PB - IEEE ER - TY - JOUR A1 - Gerber, M. A1 - Ferreira, J.A. A1 - Seliger, Norbert A1 - Hofsajer, I.W. T1 - Integral 3-D thermal, electrical and mechanical design of an automotive DC/DC converter JF - IEEE Transactions on Power Electronics KW - DC/DC converter Y1 - 2023 VL - 20 IS - 3 SP - 566 EP - 575 PB - IEEE ER - TY - JOUR A1 - Fürböck, C. A1 - Pogany, D. A1 - Litzenberger, M. A1 - Gornik, E. A1 - Seliger, Norbert A1 - Gossner, H. A1 - Müller-Lynch, T. A1 - Stecher, M. A1 - Werner, W. T1 - Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices JF - Journal of Electrostatics KW - ESD KW - smart power device Y1 - 2023 VL - 49 SP - 195 EP - 213 ER - TY - JOUR A1 - Seliger, Norbert A1 - Faltlhauser, Georg T1 - Progressive Expansion Sampling of Quasi-Static Magnetic Fields in Unconfined Regions JF - IEEE Transactions on Components, Packaging and Manufacturing Technology N2 - We present a fast and accurate measurement technique for quasi-static magnetic fields by employing a progressive sampling method in an unconfined input space. The proposed machine learning algorithm is tested against uniform sampling on printed circuit board test structures and a buck converter. We prove allocation of multiple, separated regions with predefined lateral field limits at MHz frequencies. The feasibility of equivalent magnetic dipole source modeling based on a small number of samples is demonstrated. Compared to uniform testing, progressive expansion sampling identifies contours of given field limits in less than 3% of the reference measurement time. KW - Progressive Expansion Sampling KW - Near-Field Scanning KW - Machine Learning KW - Gaussian Process Classifier KW - MoM modeling Y1 - 2023 U6 - https://doi.org/10.1109/TCPMT.2023.3283285 ER - TY - JOUR A1 - Pogany, D. A1 - Seliger, Norbert A1 - Litzenberger, M. A1 - Gossner, H. A1 - Stecher, M. A1 - Müller-Lynch, T. A1 - Werner, W. A1 - Gornik, E. T1 - Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(99)00162-6 SN - 0026-2714 VL - 39 IS - 6 SP - 1143 EP - 1148 ER - TY - JOUR A1 - Seliger, Norbert A1 - Wolfgang, E. A1 - Lefranc, G. A1 - Berg, H. A1 - Licht, T. T1 - Reliable power electronics for automotive applications JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(02)00197-X SN - 0026-2714 VL - 42 IS - 9-11 SP - 1597 EP - 1604 ER - TY - JOUR A1 - Fürböck, C. A1 - Litzenberger, M. A1 - Pogany, D. A1 - Gornik, E. A1 - Seliger, Norbert A1 - Müller-Lynch, T. A1 - Stecher, M. A1 - Goßner, H. A1 - Werner, W. T1 - Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(99)00124-9 SN - 0026-2714 VL - 39 IS - 6 SP - 925 EP - 930 ER - TY - JOUR A1 - Ramminger, S. A1 - Seliger, Norbert A1 - Wachutka, G. T1 - Reliability model for Al wire bonds subjected to heel crack failures JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(00)00139-6 SN - 0026-2714 VL - 40 IS - 8 SP - 1521 EP - 1525 ER - TY - JOUR A1 - Castellazzi, A. A1 - Kraus, R. A1 - Seliger, Norbert A1 - Schmitt-Landsiedel, D. T1 - Reliability analysis of power MOSFET’s with the help of compact models and circuit simulation JF - Microelectronics Reliability Y1 - 2023 U6 - https://doi.org/10.1016/S0026-2714(02)00198-1 SN - 0026-2714 VL - 42 IS - 9 SP - 1605 EP - 1610 ER -