3011 2025 eng 2562 2567 6 conferenceobject VDE VERLAG GMBH Berlin 0 -- -- -- This paper details the development of an accelerated AC cycling test bench for evaluating the aging mechanisms of SiC MOSFET power modules. Contrary to classical HTGS and DGS which only exercise gate source stresses the AC Cycler switched under high voltage and current. Operating for about 235 hours, the system maintained stable thermal conditions thanks to an integrated cooling system. Key precursors of aging, such as increases in threshold voltage and on-state resistance were identified using static characterization curve tracer before and after the test. Gate charge and Vdson were also measured on-line with specially developed gate drivers. Proccedings International exhibition and conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management (PCIM 2025) 978-3-8007-6541-6 10.30420/566541341 Ja Ja International exhibition and conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Conference 2025 6.-8.May 2025 Nuremberg publish Tugce Yilmaz Jorge Mari Johann Asam Michael Kirner Andreas List Lucia Fantauzzo Norbert Seliger eng uncontrolled power module eng uncontrolled SiC eng uncontrolled power cycling testing eng uncontrolled MOSFET Technik, Technologie Fakultät für Ingenieurwissenschaften Technische Hochschule Rosenheim