<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>1587</id>
    <completedYear>1997</completedYear>
    <publishedYear/>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>2833</pageFirst>
    <pageLast>2839</pageLast>
    <pageNumber/>
    <edition/>
    <issue>8</issue>
    <volume>144</volume>
    <type>article</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>2020-10-13</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">SPICE Models for Amorphous Silicon and Polysilicon Thin Film Transistors</title>
    <abstract language="eng">We describe physically based analytical models for n‐channel amorphous silicon thin film transistors and for n‐ and p‐channel polysilicon thin film transistors. The models cover all regimes of transistor operation: leakage, subthreshold, above‐threshold conduction, and the kink regime in polysilicon thin film transistors. The models contain a minimum number of parameters which are easily extracted and can be readily related to the structural and material properties of the thin film transistors. The models have been verified for a large number of devices to scale properly with device geometry.</abstract>
    <parentTitle language="eng">Journal of The Electrochemical Society</parentTitle>
    <note>Invited paper: Elec. Chem. Soc. Proc.(October 1996)</note>
    <enrichment key="PeerReviewed">Ja</enrichment>
    <enrichment key="RS_Correlation">Nein</enrichment>
    <enrichment key="review.accepted_by">2</enrichment>
    <author>M.S. Shur</author>
    <author>Holly C. Slade</author>
    <author>M.D. Jacunski</author>
    <author>A.A. Owusu</author>
    <author>T. Ytterdal</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Thin Film Transistors</value>
    </subject>
    <collection role="institutes" number="">Fakultät für Holztechnik und Bau</collection>
    <thesisPublisher>Technische Hochschule Rosenheim</thesisPublisher>
  </doc>
  <doc>
    <id>1591</id>
    <completedYear>1997</completedYear>
    <publishedYear/>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>2020-10-14</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Characterization and Modeling of Frequency Dispersion in Amorphous Silicon Thin Film Transistors</title>
    <parentTitle language="eng">Materials Research Society, Proceedings, Amorphous Silicon Technology</parentTitle>
    <enrichment key="review.accepted_by">2</enrichment>
    <author>Holly C. Slade</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Thin Film Transistors</value>
    </subject>
    <thesisPublisher>Technische Hochschule Rosenheim</thesisPublisher>
  </doc>
  <doc>
    <id>1592</id>
    <completedYear>1997</completedYear>
    <publishedYear/>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>2020-10-14</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Modeling and Scaling of a-Si:H and poly-Si Thin Film Transistors</title>
    <parentTitle language="eng">Materials Research Society, Proceedings, Amorphous Silicon Technology</parentTitle>
    <note>Invited paper</note>
    <enrichment key="RS_Correlation">Nein</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <enrichment key="review.accepted_by">2</enrichment>
    <author>M.S. Shur</author>
    <author>Holly C. Slade</author>
    <author>T. Ytterdal</author>
    <author>L. Wang</author>
    <author>Z. Xu</author>
    <author>K. Aflatooni</author>
    <author>Y. Byun</author>
    <author>Y. Chen</author>
    <author>M. Froggatt</author>
    <author>A. Krishnan</author>
    <author>P. Mei</author>
    <author>H. Meiling</author>
    <author>B.-H. Min</author>
    <author>A. Nathan</author>
    <author>S. Sherman</author>
    <author>M. Stewart</author>
    <author>S.D. Theiss</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Thin Film Transistors</value>
    </subject>
    <collection role="institutes" number="">Fakultät für Holztechnik und Bau</collection>
    <thesisPublisher>Technische Hochschule Rosenheim</thesisPublisher>
  </doc>
</export-example>
