<?xml version="1.0" encoding="utf-8"?>
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    <id>2227</id>
    <completedYear>2003</completedYear>
    <publishedYear/>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1871</pageFirst>
    <pageLast>1876</pageLast>
    <pageNumber>6</pageNumber>
    <edition/>
    <issue>9</issue>
    <volume>43</volume>
    <type>article</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>2023-06-09</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">High temperature reliability on automotive power modules verified by power cycling tests up to 150°C</title>
    <parentTitle language="deu">Microelectronics Reliability</parentTitle>
    <identifier type="issn">0026-2714</identifier>
    <identifier type="doi">10.1016/S0026-2714(03)00318-4</identifier>
    <enrichment key="opus.import.data">@articlecoquery_high_2003, title = High temperature reliability on automotive power modules verified by power cycling tests up to 150°C, volume = 43, issn = 0026-2714, url = https://www.sciencedirect.com/science/article/pii/S0026271403003184, doi = 10.1016/S0026-2714(03)00318-4, series = 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, pages = 1871–1876, number = 9, journaltitle = Microelectronics Reliability, shortjournal = Microelectronics Reliability, author = Coquery, G. and Lefranc, G. and Licht, T. and Lallemand, R. and Seliger, N. and Berg, H., urldate = 2023-06-06, date = 2003-09-01, langid = english,</enrichment>
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    <enrichment key="opus.import.date">2023-06-09T07:22:10+00:00</enrichment>
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    <author>G. Coquery</author>
    <author>G. Lefranc</author>
    <author>T. Licht</author>
    <author>R. Lallemand</author>
    <author>Norbert Seliger</author>
    <author>H. Berg</author>
    <collection role="institutes" number="">Fakultät für Ingenieurwissenschaften</collection>
    <thesisPublisher>Technische Hochschule Rosenheim</thesisPublisher>
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