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    <title language="eng">Time Domain Characterization of lattice heating in power VDMOSFETs by means of an interferometric laserprobe technique</title>
    <parentTitle language="eng">Proceedings of the 26th European Solid State Device Research Conference (ESSDERC' 96)</parentTitle>
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    <title language="eng">Backside laserprobing of transient heating in power VDMOSFETs</title>
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