<?xml version="1.0" encoding="utf-8"?>
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  <doc>
    <id>1912</id>
    <completedYear>2022</completedYear>
    <publishedYear/>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber>30</pageNumber>
    <edition/>
    <issue/>
    <volume/>
    <type>preprint</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Time to Failure under Varying Thermal Stresses</title>
    <abstract language="eng">Varying thermal stresses influence significantly the time to failure of electric components as used, for instance, in automotive devices. For applications as autonomous driving a high reliability has to be guaranteed.&#13;
  &#13;
In this article we discuss how to combine probability distributions for failure. Discrete and continuous changes of the probability distribution in time are both considered. It turns out that the temporal order of the distributions, corresponding to the succession of stresses in applications, is essential.&#13;
The latter observation restricts the general applicability of the widely used temperature collectives where only the total time of a temperature stress is considered neglecting the order of the stresses.&#13;
&#13;
An application of our results are thermal overstress tests on electric components. We may explain yet not well understood measurements for automotive electric cables.</abstract>
    <identifier type="urn">urn:nbn:de:bvb:861-opus4-19126</identifier>
    <enrichment key="RS_Correlation">Ja</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <licence>Creative Commons - CC BY-NC-ND - Namensnennung - Nicht kommerziell - Keine Bearbeitungen 4.0 International</licence>
    <author>Sven-Joachim Kimmerle</author>
    <author>Karl Dvorsky</author>
    <author>Hans-Dieter Liess</author>
    <author>Rudolf Avenhaus</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Reliability</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Applied Probability</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Data Science</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Physics of Failure</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Arrhenius Model</value>
    </subject>
    <collection role="ddc" number="51">Mathematik</collection>
    <collection role="institutes" number="">Fakultät für Angewandte Natur- und Geisteswissenschaften</collection>
    <thesisPublisher>Technische Hochschule Rosenheim</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-rosenheim/files/1912/KimmerleDvorskyLiessAvenhaus_ExtendedVersion.pdf</file>
  </doc>
</export-example>
