@inproceedings{FuerboeckThalhammerLitzenbergeretal.1999, author = {F{\"u}rb{\"o}ck, C. and Thalhammer, R. and Litzenberger, M. and Seliger, Norbert and Pogany, D. and Gornik, E. and Wachutka, G.}, title = {Internal Characterisation of IGBTs Using the Backside Laserprober Technique}, series = {Jahrestagung der GMe, Bad Hofgastein Tagungsband 1999}, booktitle = {Jahrestagung der GMe, Bad Hofgastein Tagungsband 1999}, publisher = {Gesellschaft f{\"u}r Mikroelektronik (GMe)}, isbn = {3-901678-04-8}, year = {1999}, language = {en} } @inproceedings{FuerboeckThalhammerLitzenbergeretal.1999, author = {F{\"u}rb{\"o}ck, C. and Thalhammer, R. and Litzenberger, M. and Seliger, Norbert and Pogany, D. and Gornik, E. and Wachutka, G.}, title = {A differential backside laserprobing technique for the investigation of the lateral temperature distribution in power devices}, series = {11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings}, booktitle = {11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings}, publisher = {IEEE}, doi = {10.1109/ISPSD.1999.764095}, pages = {193 -- 196}, year = {1999}, language = {en} }