@techreport{BarthBeneckenBetzetal.2016, author = {Barth, Simon and Benecken, Gerd and Betz, Andreas and Binninger, Karsten and Graule, Verena and Hack, Andreas and Haegele, Rainer and Hartmann, Markus and Hauck-Bauer, Eva and Haut, Sandra and J{\"a}ger, Johannes and Kagerl, Andreas and Karlinger, Peter and Konle, Elke and K{\"o}ster, Heinrich and Krause, Harald and Krommes, Sandra and Meissner, Thomas and Michanickl, Andreas and Sandor, Viktor and Schanda, Ulrich and Schemme, Michael and Sebald, Daniela and Spindler, Uli and Stauss, Kilian and Strobl, Thomas and Sussmann, Monika and Versen, Martin and Voit, Johann and Wambsganß, Mathias and Wellisch, Ulrich and Zauner, Johannes}, title = {Forschungsbericht 2015}, organization = {Hochschule Rosenheim}, url = {http://nbn-resolving.de/urn:nbn:de:bvb:861-opus4-12304}, pages = {76}, year = {2016}, abstract = {Mit dem j{\"a}hrlich erscheinenden Forschungsbericht m{\"o}chte die Hochschule Rosenheim einen Einblick in ihre vielf{\"a}ltigen Projekte und Aktivit{\"a}ten der angewandten Forschung und Entwicklung geben. Im Forschungsbericht 2015 wird {\"u}ber Vorhaben im Jahr 2015 berichtet.}, language = {de} } @inproceedings{WohlschlaegerVersen2019, author = {Wohlschl{\"a}ger, Maximilian and Versen, Martin}, title = {Bestimmung einer Quanteneffizienz f{\"u}r das automatisierte Sortieren von Kunststoffen durch Fluoreszenz}, series = {AALE 2019 - Autonome und intelligente Systeme in der Automatisierungstechnik 16. Fachkonferenz}, booktitle = {AALE 2019 - Autonome und intelligente Systeme in der Automatisierungstechnik 16. Fachkonferenz}, editor = {Bauer, Benedict and Wittenberg, Carsten}, publisher = {VDE Verlag}, address = {Berlin}, isbn = {978-3-8007-4860-0}, pages = {179 -- 187}, year = {2019}, language = {de} } @inproceedings{KneisslVersen2019, author = {Kneißl, M. and Versen, Martin}, title = {Erh{\"o}hung der Bandbreite eines Stromregelkreises durch Hadamard-Modulation}, series = {AALE 2019 - Autonome und intelligente Systeme in der Automatisierungstechnik 16. Fachkonferenz}, booktitle = {AALE 2019 - Autonome und intelligente Systeme in der Automatisierungstechnik 16. Fachkonferenz}, editor = {Bauer, Benedict and Wittenberg, Carsten}, publisher = {VDE Verlag}, address = {Berlin}, isbn = {978-3-8007-4860-0}, pages = {277 -- 285}, year = {2019}, language = {de} } @inproceedings{WohlschlaegerVersen2019, author = {Wohlschl{\"a}ger, Maximilian and Versen, Martin}, title = {Detektion von Kunststoffen in Wasser mithilfe von Fluoreszenz}, series = {20. GMA/ITG-Fachtagung Sensoren und Messsysteme 2019}, booktitle = {20. GMA/ITG-Fachtagung Sensoren und Messsysteme 2019}, publisher = {AMA Service GmbH}, address = {Wunstorf}, isbn = {978-3-9819376-0-2}, pages = {687 -- 694}, year = {2019}, abstract = {Die wohl gr{\"o}ßte aktuelle Umweltverschmutzung mit Kunststoffen findet in Ozeanen, Seen und Fl{\"u}ssen statt. Bis jetzt gibt es kein etabliertes Verfahren, mit dem Kunststoffe in Umwelt- bzw. Wassermatrizen detektiert werden k{\"o}nnen. Deshalb wird mit einem Verfahren, welches auf dem Prinzip der Fluoreszenz basiert, untersucht, ob unter Laborbedingungen Kunststoffe in Wasser detektiert und identifiziert werden k{\"o}nnen. Anhand eines mathematischen Modells, einer Simulation und mit Hilfe von optischen Experimenten wird gezeigt, dass der Nachweis und auch eine Identifikation von Kunststoffen in Abh{\"a}ngigkeit der Wassertiefe, mit diesem Verfahren m{\"o}glich ist.}, language = {de} } @incollection{Versen2019, author = {Versen, Martin}, title = {DRAM Failure Analysis and Defect Localization Techniques}, series = {Microelectronics Failure Analysis, Desk Reference}, booktitle = {Microelectronics Failure Analysis, Desk Reference}, editor = {Gandhi, Tejinder}, edition = {Seventh Edition}, publisher = {ASM International}, address = {Ohio}, isbn = {978-1-62708-247-1}, publisher = {Technische Hochschule Rosenheim}, pages = {499 -- 505}, year = {2019}, language = {en} } @inproceedings{WohlschlaegerVersenHolstetal.2019, author = {Wohlschl{\"a}ger, Maximilian and Versen, Martin and Holst, Gerhard and Franke, Robert}, title = {An Approach of Identifying Polymers With Fluorescence Lifetime Imaging}, series = {2019 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech)}, booktitle = {2019 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech)}, pages = {186 -- 189}, year = {2019}, abstract = {Nowadays, fluorescence lifetime measurements and the method of fluorescence lifetime imaging are already state of the art in biomedical research. Also first investigations show that polymers could be identified due to their endogenous fluorescent lifetime. Thus an approach of identifying polymers with fluorescence lifetime imaging is done in this contribution. Therefore, four different polymers are examined and evaluated with statistical methods in order to determine their specific fluorescence lifetimes.}, language = {en} } @inproceedings{DahlbergVersen2019, author = {Dahlberg, B. and Versen, Martin}, title = {Loop transformation algorithm for test vector accessing at high speed}, series = {ISTFA 2019: Proceedings from the 45th International Symposium for Testing and Failure Analysis}, booktitle = {ISTFA 2019: Proceedings from the 45th International Symposium for Testing and Failure Analysis}, pages = {434 -- 439}, year = {2019}, language = {en} } @inproceedings{WohlschlaegerVersenLanghals2019, author = {Wohlschl{\"a}ger, Maximilian and Versen, Martin and Langhals, H.}, title = {A method for sorting of plastics with an apparatus specific quantum efficiency approach}, series = {2019 IEEE Sensors Applications Symposium (SAS)}, booktitle = {2019 IEEE Sensors Applications Symposium (SAS)}, year = {2019}, abstract = {Today, the automatic separation of polymers from each other in an industrial scale is an unsolved problem. In laboratory environments, two methods are known whereby plastic is sorted either by color or by fluorescence decay time measurements that require fast synchronization and thus expensive equipment. A simple and pragmatic process is proposed to separate plastics from each other: all fluorescent photons are counted in relation to the absorbed photons. A theoretical model and an experimental setup are built in order to determine an apparatus specific quantum efficiency.}, language = {en} } @inproceedings{VersenKipfelsberger2014, author = {Versen, Martin and Kipfelsberger, S.}, title = {Introduction to microcomputer technology with the MSP430 Launch Pad in remote labs}, series = {Global Engineering Education Conference (EDUCON), 2014 IEEE}, booktitle = {Global Engineering Education Conference (EDUCON), 2014 IEEE}, year = {2014}, abstract = {Texas Instruments' MSP430 Launch Pad is used as a key component for remote labs that complement an introduction course to microcomputer technology in the bachelor program Mechatronic at the University of Applied Sciences in Rosenheim. The remote labs use breakout boards and include a timer experiment with generation of pulse width modulation signals, I2C communication and analog to digital conversion.}, language = {en} } @inproceedings{VersenBernhardtHeigletal.2012, author = {Versen, Martin and Bernhardt, and Heigl, M. and Viehhauser, P. and Zentgraf, P.}, title = {System for real-time data acquisition and processing on a hail-fighter aeroplane}, series = {Proceedings of the 5th European DSP Education and Research Conference}, booktitle = {Proceedings of the 5th European DSP Education and Research Conference}, year = {2012}, abstract = {The System HAILsens implements a device for Real-Time sensor data processing, running on a Texas Instruments Concerto M3 core. An I2C interface is used for sensor communications. Ethernet with UDP on a custom developed three layered frame organisation of sensor data serves as a link to the main system on board of an aeroplane. For backing up the acquired data, all frames are locally stored on an SD Card. To have the possibility of easily checking the current system status, an LCD module and a push-button provide a minimal user interface.}, language = {en} } @incollection{Versen2011, author = {Versen, Martin}, title = {DRAM Failure Analysis and Defect Localization Techniques, Microelectronics Failure Analysis}, series = {Desk Reference Sixth Edition}, booktitle = {Desk Reference Sixth Edition}, publisher = {ASM International}, address = {Ohio}, publisher = {Technische Hochschule Rosenheim}, year = {2011}, abstract = {Comprehensive guide to the process and test methods used for electronic device failure analysis. Contains dozens of articles—contributed by industry experts—covering a wide range of topics involving the failure analysis of microelectronics. It places the most important and up-to-date information on this subject at your fingertips.  Topic coverage includes:  Failure Analysis Process Flow Failure Verification  Failure Modes and Failure Classification  Special Devices (MEMS, Optoelectronics, Passives)  Fault Localization Techniques: Package Level (NDT)  Die Level (Depackaging, Photon Emission, Microthermography, Laser-Based Methods, Particle Beam Methods)  Deprocessing \& Imaging Techniques: Deprocessing  General Imaging Techniques  Local Deprocessing \& Imaging  Circuit Edit and Design Modification  Material Analysis Techniques  Reference Information: Important Topics for Semiconductor Devices  Failure Analysis Techniques Roadmap  Failure Analysis Operations and Management  Appendices: Failure Analysis Terms, Definitions, and Acronyms  Industry Standards}, language = {en} }