@article{RammingerSeligerWachutka2000, author = {Ramminger, S. and Seliger, Norbert and Wachutka, G.}, title = {Reliability model for Al wire bonds subjected to heel crack failures}, series = {Microelectronics Reliability}, volume = {40}, journal = {Microelectronics Reliability}, number = {8}, issn = {0026-2714}, doi = {10.1016/S0026-2714(00)00139-6}, pages = {1521 -- 1525}, year = {2000}, language = {en} } @inproceedings{SeligerRammingerFrankeetal.2000, author = {Seliger, Norbert and Ramminger, S. and Franke, T. and Wachutka, G.}, title = {A study of heel crack failures in wire bonds under mechanical cycling}, series = {Proceedings of Micromat 2000}, booktitle = {Proceedings of Micromat 2000}, year = {2000}, language = {en} } @inproceedings{RenkenEhbauerKarreretal.2007, author = {Renken, F. and Ehbauer, G. and Karrer, V. and Knorr, R. and Ramminger, S. and Seliger, Norbert and Wolfgang, E.}, title = {Reliability of high temperature inverters for HEV}, series = {Proceedings Power Conversion Conference}, booktitle = {Proceedings Power Conversion Conference}, publisher = {IEEE}, address = {Nagoya}, doi = {10.1109/PCCON.2007.373022}, pages = {563 -- 568}, year = {2007}, language = {en} }