@inproceedings{ThalhammerFuerboeckSeligeretal.1998, author = {Thalhammer, R. and Fuerboeck, C. and Seliger, Norbert and Gornik, E. and Wachutka, G.}, title = {Validation and calibration of Electrothermal Device Models Using Infrared Laser Probing Techniques}, series = {Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems (Proc. of MSM'98)}, booktitle = {Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems (Proc. of MSM'98)}, pages = {213 -- 217}, year = {1998}, language = {en} } @article{SeligerGornikPoganyetal.1998, author = {Seliger, Norbert and Gornik, E. and Pogany, D. and Fuerboeck, C. and Habas, P. and Thalhammer, R. and Stoisiek, M.}, title = {Characterisation of Semiconductor Devices by Infrared Laser Interferometry}, series = {E\&I Elektrotechnik und Informationstechnik, Sonderheft Trends in der Mikrotechnik}, journal = {E\&I Elektrotechnik und Informationstechnik, Sonderheft Trends in der Mikrotechnik}, number = {7-8}, doi = {10.1007/BF03159611}, pages = {403 -- 403}, year = {1998}, language = {en} } @inproceedings{ThalhammerFuerboeckSeligeretal.1998, author = {Thalhammer, R. and Fuerboeck, C. and Seliger, Norbert and Deboy, G. and Gornik, E. and Wachutka, G.}, title = {Internal characterization of IGBTs using the backside laser probing technique - Interpretation of measurement by numerical simulation}, series = {Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs (Proc. of ISPSD)}, booktitle = {Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs (Proc. of ISPSD)}, doi = {10.1109/ISPSD.1998.702668}, pages = {199 -- 202}, year = {1998}, language = {en} } @inproceedings{FuerboeckThalhammerSeligeretal.1997, author = {Fuerboeck, C. and Thalhammer, R. and Seliger, Norbert and Pogany, D. and Deboy, G. and Wachutka, G. and Gornik, E.}, title = {Lokale Temperaturbestimmung in Insulated Gate Bipolar Transistoren (IGBTs) mittels Lasersondentechnik}, series = {Beitr{\"a}ge der Informationstagung ME 97 OVE-Schriftenreihe; Nr. 14 (ISBN 3-85133-010-2)}, volume = {14}, booktitle = {Beitr{\"a}ge der Informationstagung ME 97 OVE-Schriftenreihe; Nr. 14 (ISBN 3-85133-010-2)}, pages = {117 -- 122}, year = {1997}, language = {en} } @inproceedings{FuerboeckThalhammerLitzenbergeretal.1999, author = {F{\"u}rb{\"o}ck, C. and Thalhammer, R. and Litzenberger, M. and Seliger, Norbert and Pogany, D. and Gornik, E. and Wachutka, G.}, title = {Internal Characterisation of IGBTs Using the Backside Laserprober Technique}, series = {Jahrestagung der GMe, Bad Hofgastein Tagungsband 1999}, booktitle = {Jahrestagung der GMe, Bad Hofgastein Tagungsband 1999}, publisher = {Gesellschaft f{\"u}r Mikroelektronik (GMe)}, isbn = {3-901678-04-8}, year = {1999}, language = {en} } @inproceedings{FuerboeckThalhammerLitzenbergeretal.1999, author = {F{\"u}rb{\"o}ck, C. and Thalhammer, R. and Litzenberger, M. and Seliger, Norbert and Pogany, D. and Gornik, E. and Wachutka, G.}, title = {A differential backside laserprobing technique for the investigation of the lateral temperature distribution in power devices}, series = {11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings}, booktitle = {11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings}, publisher = {IEEE}, doi = {10.1109/ISPSD.1999.764095}, pages = {193 -- 196}, year = {1999}, language = {en} }