@article{PoganySeligerLitzenbergeretal.1999, author = {Pogany, D. and Seliger, Norbert and Litzenberger, M. and Gossner, H. and Stecher, M. and M{\"u}ller-Lynch, T. and Werner, W. and Gornik, E.}, title = {Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices}, series = {Microelectronics Reliability}, volume = {39}, journal = {Microelectronics Reliability}, number = {6}, issn = {0026-2714}, doi = {10.1016/S0026-2714(99)00162-6}, pages = {1143 -- 1148}, year = {1999}, language = {en} } @inproceedings{FuerboeckThalhammerLitzenbergeretal.1999, author = {F{\"u}rb{\"o}ck, C. and Thalhammer, R. and Litzenberger, M. and Seliger, Norbert and Pogany, D. and Gornik, E. and Wachutka, G.}, title = {A differential backside laserprobing technique for the investigation of the lateral temperature distribution in power devices}, series = {11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings}, booktitle = {11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings}, publisher = {IEEE}, doi = {10.1109/ISPSD.1999.764095}, pages = {193 -- 196}, year = {1999}, language = {en} } @inproceedings{FuerboeckPoganyLitzenbergeretal.1999, author = {F{\"u}rb{\"o}ck, C. and Pogany, D. and Litzenberger, M. and Gornik, E. and Seliger, Norbert and Gossner, H. and M{\"u}ller-Lynch, T. and Stecher, M. and Werner, W.}, title = {Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices}, series = {Electrical Overstress/Electrostatic Discharge Symposium Proceedings}, booktitle = {Electrical Overstress/Electrostatic Discharge Symposium Proceedings}, publisher = {IEEE}, doi = {10.1109/EOSESD.1999.819067}, pages = {241 -- 250}, year = {1999}, language = {en} } @article{FuerboeckPoganyLitzenbergeretal.2000, author = {F{\"u}rb{\"o}ck, C. and Pogany, D. and Litzenberger, M. and Gornik, E. and Seliger, Norbert and Gossner, H. and M{\"u}ller-Lynch, T. and Stecher, M. and Werner, W.}, title = {Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices}, series = {Journal of Electrostatics}, volume = {49}, journal = {Journal of Electrostatics}, pages = {195 -- 213}, year = {2000}, language = {en} }