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{1998}, language = {en} } @inproceedings{BurianPoganyLalinskyetal.1997, author = {Burian, E. and Pogany, D. and Lalinsky, T. and Seliger, Norbert and Gornik, E.}, title = {Thermal Simulation and characterization of GaAs micromachined power sensor microsystems}, series = {Eurosensors XI}, booktitle = {Eurosensors XI}, pages = {949 -- 952}, year = {1997}, language = {en} } @inproceedings{FuerboeckThalhammerSeligeretal.1997, author = {Fuerboeck, C. and Thalhammer, R. and Seliger, Norbert and Pogany, D. and Deboy, G. and Wachutka, G. and Gornik, E.}, title = {Lokale Temperaturbestimmung in Insulated Gate Bipolar Transistoren (IGBTs) mittels Lasersondentechnik}, series = {Beitr{\"a}ge der Informationstagung ME 97 OVE-Schriftenreihe; Nr. 14 (ISBN 3-85133-010-2)}, volume = {14}, booktitle = {Beitr{\"a}ge der Informationstagung ME 97 OVE-Schriftenreihe; Nr. 14 (ISBN 3-85133-010-2)}, pages = {117 -- 122}, year = {1997}, language = {en} } @article{SeligerPoganyFuerboecketal.1997, author = {Seliger, Norbert and Pogany, D. and Fuerboeck, C. and Habas, P. and Gornik, E.}, title = {A laser beam method for evaluation of thermal time constant in smart power devices}, series = {Microelectronics Reliability}, volume = {37}, journal = {Microelectronics Reliability}, number = {10/11}, doi = {10.1016/S0026-2714(97)00149-2}, pages = {1727 -- 1730}, year = {1997}, language = {en} } @inproceedings{PoganyFuerboeckSeligeretal.1997, author = {Pogany, D. and Fuerboeck, C. and Seliger, Norbert and Habas, P. and Gornik, E. and Kubicek, S. and Decoutere, S.}, title = {Optical Testing of submicron-technology MOSFETs and bipolar transistors}, series = {European Solid-State Device Research Conference (ESSDERC' 97)}, booktitle = {European Solid-State Device Research Conference (ESSDERC' 97)}, editor = {Gr{\"u}nbacher, H.}, pages = {372 -- 375}, year = {1997}, language = {en} } @inproceedings{SeligerPoganyFuerboecketal.1997, author = {Seliger, Norbert and Pogany, D. and Fuerboeck, C. and Habas, P. and Gornik, E. and Stoisiek, M.}, title = {A study of temperature distribution in SOI-smart power devices in transient conditions by optical interferometry}, series = {27th European Solid-State Device Research Conference (ESSDERC' 97)}, booktitle = {27th European Solid-State Device Research Conference (ESSDERC' 97)}, editor = {Gr{\"u}nbacher, H.}, pages = {372 -- 375}, year = {1997}, language = {en} } @incollection{SeligerFuerboeckHabasetal.1997, author = {Seliger, Norbert and Fuerboeck, C. and Habas, P. and Pogany, D. and Gornik, E.}, title = {Backside-Laserprober Technique for Characterisation of Semiconductor Power Devices}, series = {Proceedings of the Seminar Basics and Technology of Electronic Devices}, booktitle = {Proceedings of the Seminar Basics and Technology of Electronic Devices}, publisher = {Technische Hochschule Rosenheim}, pages = {143 -- 147}, year = {1997}, language = {en} } @article{SeligerHabasPoganyetal.1997, author = {Seliger, Norbert and Habas, P. and Pogany, D. and Gornik, E.}, title = {Time-Resolved Analysis of Self-Heating in Power VDMOSFETs Using Backside-Laserprobing}, series = {Solid-State Electronics}, volume = {41}, journal = {Solid-State Electronics}, number = {9}, doi = {10.1016/S0038-1101(97)00131-7}, pages = {1285 -- 1292}, year = {1997}, language = {en} } @article{FuerboeckSeligerPoganyetal.1998, author = {Fuerboeck, C. and Seliger, Norbert and Pogany, D. and Litzenberger, M. and Gornik, E. and Stecher, M. and Gosser, H. and Werner, W.}, title = {Backside laserprober characterization of thermal effects during high current stress in smart power ESD protection devices}, series = {International Electron Devices Meeting (IEDM '98) Technical Digest}, journal = {International Electron Devices Meeting (IEDM '98) Technical Digest}, doi = {10.1109/IEDM.1998.746451}, pages = {691 -- 694}, year = {1998}, language = {en} } @article{PoganySeligerGorniketal.1998, author = {Pogany, D. and Seliger, Norbert and Gornik, E. and Stoisiek, M. and Lalinsky, T.}, title = {Analysis of the temperature evolution from the time resolved thermo-optical interferometric measurements with few Fabry-Perot peaks}, series = {Journal of Applied Physics}, volume = {84}, journal = {Journal of Applied Physics}, number = {8}, doi = {10.1063/1.368674}, pages = {4495 -- 4501}, year = {1998}, language = {en} } @inproceedings{PoganyLalinskySeligeretal.1996, author = {Pogany, D. and Lalinsky, T. and Seliger, Norbert and Kuzmik, J. and Habas, P. and Hrkut, P. and Gornik, E.}, title = {Power Sensor Microsystems Characterization using a contactless optical laser method}, series = {International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM' 96)}, booktitle = {International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM' 96)}, pages = {201 -- 204}, year = {1996}, language = {en} } @inproceedings{PoganySeligerLalinskyetal.1996, author = {Pogany, D. and Seliger, Norbert and Lalinsky, T. and Kuzmik, J. and Habas, P. and Hrkut, P. and Gornik, E.}, title = {Study of thermal effects in GaAs micromachined power sensor microsystems by an optical interferometer technique}, series = {International Workshop on Thermal Investigation of ICs and Systems (THERMINIC' 96)}, booktitle = {International Workshop on Thermal Investigation of ICs and Systems (THERMINIC' 96)}, pages = {185 -- 190}, year = {1996}, language = {en} } @inproceedings{SeligerHabasKoecketal.1996, author = {Seliger, Norbert and Habas, P. and Koeck, A. and Pogany, D. and Gornik, E.}, title = {Backside laserprobing of transient heating in power VDMOSFETs}, series = {International Seminar on Power Semiconductors (ISPS)}, booktitle = {International Seminar on Power Semiconductors (ISPS)}, pages = {115 -- 122}, year = {1996}, language = {en} } @inproceedings{FuerboeckThalhammerLitzenbergeretal.1999, author = {F{\"u}rb{\"o}ck, C. and Thalhammer, R. and Litzenberger, M. and Seliger, Norbert and Pogany, D. and Gornik, E. and Wachutka, G.}, title = {Internal Characterisation of IGBTs Using the Backside Laserprober Technique}, series = {Jahrestagung der GMe, Bad Hofgastein Tagungsband 1999}, booktitle = {Jahrestagung der GMe, Bad Hofgastein Tagungsband 1999}, publisher = {Gesellschaft f{\"u}r Mikroelektronik (GMe)}, isbn = {3-901678-04-8}, year = {1999}, language = {en} } @article{FuerboeckLitzenbergerPoganyetal.1999, author = {F{\"u}rb{\"o}ck, C. and Litzenberger, M. and Pogany, D. and Gornik, E. and Seliger, Norbert and M{\"u}ller-Lynch, T. and Stecher, M. and Goßner, H. and Werner, W.}, title = {Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress}, series = {Microelectronics Reliability}, volume = {39}, journal = {Microelectronics Reliability}, number = {6}, issn = {0026-2714}, doi = {10.1016/S0026-2714(99)00124-9}, pages = {925 -- 930}, year = {1999}, language = {en} } @article{PoganySeligerLitzenbergeretal.1999, author = {Pogany, D. and Seliger, Norbert and Litzenberger, M. and Gossner, H. and Stecher, M. and M{\"u}ller-Lynch, T. and Werner, W. and Gornik, E.}, title = {Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices}, series = {Microelectronics Reliability}, volume = {39}, journal = {Microelectronics Reliability}, number = {6}, issn = {0026-2714}, doi = {10.1016/S0026-2714(99)00162-6}, pages = {1143 -- 1148}, year = {1999}, language = {en} } @inproceedings{FuerboeckThalhammerLitzenbergeretal.1999, author = {F{\"u}rb{\"o}ck, C. and Thalhammer, R. and Litzenberger, M. and Seliger, Norbert and Pogany, D. and Gornik, E. and Wachutka, G.}, title = {A differential backside laserprobing technique for the investigation of the lateral temperature distribution in power devices}, series = {11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings}, booktitle = {11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings}, publisher = {IEEE}, doi = {10.1109/ISPSD.1999.764095}, pages = {193 -- 196}, year = {1999}, language = {en} } @inproceedings{FuerboeckPoganyLitzenbergeretal.1999, author = {F{\"u}rb{\"o}ck, C. and Pogany, D. and Litzenberger, M. and Gornik, E. and Seliger, Norbert and Gossner, H. and M{\"u}ller-Lynch, T. and Stecher, M. and Werner, W.}, title = {Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices}, series = {Electrical Overstress/Electrostatic Discharge Symposium Proceedings}, booktitle = {Electrical Overstress/Electrostatic Discharge Symposium Proceedings}, publisher = {IEEE}, doi = {10.1109/EOSESD.1999.819067}, pages = {241 -- 250}, year = {1999}, language = {en} } @article{FuerboeckPoganyLitzenbergeretal.2000, author = {F{\"u}rb{\"o}ck, C. and Pogany, D. and Litzenberger, M. and Gornik, E. and Seliger, Norbert and Gossner, H. and M{\"u}ller-Lynch, T. and Stecher, M. and Werner, W.}, title = {Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices}, series = {Journal of Electrostatics}, volume = {49}, journal = {Journal of Electrostatics}, pages = {195 -- 213}, year = {2000}, language = {en} }