@inproceedings{ZentgrafBergeChassetetal.2010, author = {Zentgraf, Peter and Berge, S. and Chasset, C. and Filippi, H. and Gottzein, E. and Guti{\´e}rrez-Ca{\~n}as, I. and Hartrampf, M. and Krauss, P. A. and Kuehl, C. and L{\"u}bke- Ossenbeck, B. and Mittnacht, M. and Montenbruck, O. and M{\"u}ller, C. and Rueda Boldo, P. and Truffi, A.}, title = {PREPARING THE GPS-EXPERIMENT FOR THE SMALL GEO MISSION}, series = {33rd ANNUAL AAS GUIDANCE AND CONTROL CONFERENCE}, booktitle = {33rd ANNUAL AAS GUIDANCE AND CONTROL CONFERENCE}, editor = {American Astronautical Society,}, year = {2010}, abstract = {This paper deals with the preparation of the Small GEO mission and the accommodation of a GPS receiver as an experiment. The expected benefits of using the GPS receiver for Small GEO are explained. The feasibility of using GPS for position determination is investigated by simulation using a MosaicGNSS receiver, which was stimulated by a Spirent RF signal generator. A procedure, how to evaluate flight data on ground is outlined. Success criteria of the experiment and the minimal size of the downlink stream required and reserved for the receiver TM are presented.}, language = {en} } @article{FuerboeckLitzenbergerPoganyetal.1999, author = {F{\"u}rb{\"o}ck, C. and Litzenberger, M. and Pogany, D. and Gornik, E. and Seliger, Norbert and M{\"u}ller-Lynch, T. and Stecher, M. and Goßner, H. and Werner, W.}, title = {Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress}, series = {Microelectronics Reliability}, volume = {39}, journal = {Microelectronics Reliability}, number = {6}, issn = {0026-2714}, doi = {10.1016/S0026-2714(99)00124-9}, pages = {925 -- 930}, year = {1999}, language = {en} } @inproceedings{FuerboeckPoganyLitzenbergeretal.1999, author = {F{\"u}rb{\"o}ck, C. and Pogany, D. and Litzenberger, M. and Gornik, E. and Seliger, Norbert and Gossner, H. and M{\"u}ller-Lynch, T. and Stecher, M. and Werner, W.}, title = {Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices}, series = {Electrical Overstress/Electrostatic Discharge Symposium Proceedings}, booktitle = {Electrical Overstress/Electrostatic Discharge Symposium Proceedings}, publisher = {IEEE}, doi = {10.1109/EOSESD.1999.819067}, pages = {241 -- 250}, year = {1999}, language = {en} } @article{FuerboeckPoganyLitzenbergeretal.2000, author = {F{\"u}rb{\"o}ck, C. and Pogany, D. and Litzenberger, M. and Gornik, E. and Seliger, Norbert and Gossner, H. and M{\"u}ller-Lynch, T. and Stecher, M. and Werner, W.}, title = {Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices}, series = {Journal of Electrostatics}, volume = {49}, journal = {Journal of Electrostatics}, pages = {195 -- 213}, year = {2000}, language = {en} }