@inproceedings{ThalhammerFuerboeckSeligeretal.1998, author = {Thalhammer, R. and Fuerboeck, C. and Seliger, Norbert and Gornik, E. and Wachutka, G.}, title = {Validation and calibration of Electrothermal Device Models Using Infrared Laser Probing Techniques}, series = {Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems (Proc. of MSM'98)}, booktitle = {Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems (Proc. of MSM'98)}, pages = {213 -- 217}, year = {1998}, language = {en} } @article{SeligerGornikPoganyetal.1998, author = {Seliger, Norbert and Gornik, E. and Pogany, D. and Fuerboeck, C. and Habas, P. and Thalhammer, R. and Stoisiek, M.}, title = {Characterisation of Semiconductor Devices by Infrared Laser Interferometry}, series = {E\&I Elektrotechnik und Informationstechnik, Sonderheft Trends in der Mikrotechnik}, journal = {E\&I Elektrotechnik und Informationstechnik, Sonderheft Trends in der Mikrotechnik}, number = {7-8}, doi = {10.1007/BF03159611}, pages = {403 -- 403}, year = {1998}, language = {en} } @inproceedings{ThalhammerFuerboeckSeligeretal.1998, author = {Thalhammer, R. and Fuerboeck, C. and Seliger, Norbert and Deboy, G. and Gornik, E. and Wachutka, G.}, title = {Internal characterization of IGBTs using the backside laser probing technique - Interpretation of measurement by numerical simulation}, series = {Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs (Proc. of ISPSD)}, booktitle = {Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs (Proc. of ISPSD)}, doi = {10.1109/ISPSD.1998.702668}, pages = {199 -- 202}, year = {1998}, language = {en} } @inproceedings{FuerboeckThalhammerSeligeretal.1997, author = {Fuerboeck, C. and Thalhammer, R. and Seliger, Norbert and Pogany, D. and Deboy, G. and Wachutka, G. and Gornik, E.}, title = {Lokale Temperaturbestimmung in Insulated Gate Bipolar Transistoren (IGBTs) mittels Lasersondentechnik}, series = {Beitr{\"a}ge der Informationstagung ME 97 OVE-Schriftenreihe; Nr. 14 (ISBN 3-85133-010-2)}, volume = {14}, booktitle = {Beitr{\"a}ge der Informationstagung ME 97 OVE-Schriftenreihe; Nr. 14 (ISBN 3-85133-010-2)}, pages = {117 -- 122}, year = {1997}, language = {en} } @article{SeligerPoganyFuerboecketal.1997, author = {Seliger, Norbert and Pogany, D. and Fuerboeck, C. and Habas, P. and Gornik, E.}, title = {A laser beam method for evaluation of thermal time constant in smart power devices}, series = {Microelectronics Reliability}, volume = {37}, journal = {Microelectronics Reliability}, number = {10/11}, doi = {10.1016/S0026-2714(97)00149-2}, pages = {1727 -- 1730}, year = {1997}, language = {en} } @inproceedings{PoganyFuerboeckSeligeretal.1997, author = {Pogany, D. and Fuerboeck, C. and Seliger, Norbert and Habas, P. and Gornik, E. and Kubicek, S. and Decoutere, S.}, title = {Optical Testing of submicron-technology MOSFETs and bipolar transistors}, series = {European Solid-State Device Research Conference (ESSDERC' 97)}, booktitle = {European Solid-State Device Research Conference (ESSDERC' 97)}, editor = {Gr{\"u}nbacher, H.}, pages = {372 -- 375}, year = {1997}, language = {en} } @inproceedings{SeligerPoganyFuerboecketal.1997, author = {Seliger, Norbert and Pogany, D. and Fuerboeck, C. and Habas, P. and Gornik, E. and Stoisiek, M.}, title = {A study of temperature distribution in SOI-smart power devices in transient conditions by optical interferometry}, series = {27th European Solid-State Device Research Conference (ESSDERC' 97)}, booktitle = {27th European Solid-State Device Research Conference (ESSDERC' 97)}, editor = {Gr{\"u}nbacher, H.}, pages = {372 -- 375}, year = {1997}, language = {en} } @incollection{SeligerFuerboeckHabasetal.1997, author = {Seliger, Norbert and Fuerboeck, C. and Habas, P. and Pogany, D. and Gornik, E.}, title = {Backside-Laserprober Technique for Characterisation of Semiconductor Power Devices}, series = {Proceedings of the Seminar Basics and Technology of Electronic Devices}, booktitle = {Proceedings of the Seminar Basics and Technology of Electronic Devices}, publisher = {Technische Hochschule Rosenheim}, pages = {143 -- 147}, year = {1997}, language = {en} } @article{FuerboeckSeligerPoganyetal.1998, author = {Fuerboeck, C. and Seliger, Norbert and Pogany, D. and Litzenberger, M. and Gornik, E. and Stecher, M. and Gosser, H. and Werner, W.}, title = {Backside laserprober characterization of thermal effects during high current stress in smart power ESD protection devices}, series = {International Electron Devices Meeting (IEDM '98) Technical Digest}, journal = {International Electron Devices Meeting (IEDM '98) Technical Digest}, doi = {10.1109/IEDM.1998.746451}, pages = {691 -- 694}, year = {1998}, language = {en} }