@article{KanertDettmerPlikatetal.2003, author = {Kanert, W. and Dettmer, H. and Plikat, B. and Seliger, Norbert}, title = {Reliability aspects of semiconductor devices in high temperature applications}, series = {Microelectronics Reliability}, volume = {43}, journal = {Microelectronics Reliability}, number = {9}, issn = {0026-2714}, doi = {10.1016/S0026-2714(03)00313-5}, pages = {1839 -- 1846}, year = {2003}, language = {en} }