@incollection{Versen2011, author = {Versen, Martin}, title = {DRAM Failure Analysis and Defect Localization Techniques, Microelectronics Failure Analysis}, series = {Desk Reference Sixth Edition}, booktitle = {Desk Reference Sixth Edition}, publisher = {ASM International}, address = {Ohio}, publisher = {Technische Hochschule Rosenheim}, year = {2011}, abstract = {Comprehensive guide to the process and test methods used for electronic device failure analysis. Contains dozens of articles—contributed by industry experts—covering a wide range of topics involving the failure analysis of microelectronics. It places the most important and up-to-date information on this subject at your fingertips.  Topic coverage includes:  Failure Analysis Process Flow Failure Verification  Failure Modes and Failure Classification  Special Devices (MEMS, Optoelectronics, Passives)  Fault Localization Techniques: Package Level (NDT)  Die Level (Depackaging, Photon Emission, Microthermography, Laser-Based Methods, Particle Beam Methods)  Deprocessing \& Imaging Techniques: Deprocessing  General Imaging Techniques  Local Deprocessing \& Imaging  Circuit Edit and Design Modification  Material Analysis Techniques  Reference Information: Important Topics for Semiconductor Devices  Failure Analysis Techniques Roadmap  Failure Analysis Operations and Management  Appendices: Failure Analysis Terms, Definitions, and Acronyms  Industry Standards}, language = {en} } @inproceedings{Versen2011, author = {Versen, Martin}, title = {Worst Case Test Conditions for Defect Localization in DRAM Devices}, series = {Microelectronics Seminar of the ISTFA 2011}, booktitle = {Microelectronics Seminar of the ISTFA 2011}, year = {2011}, language = {en} } @inproceedings{VersenShankarEnimidisettyetal.2011, author = {Versen, Martin and Shankar, S. and Enimidisetty, S. and Bernhardt, A. and Srinivasan, B.}, title = {Setup for Locating PV-Cell Surface Defects Through ISC Measurements}, series = {Proceedings of the 37th ISTFA 2011}, booktitle = {Proceedings of the 37th ISTFA 2011}, year = {2011}, language = {en} } @inproceedings{WeidnerKasparSeliger2011, author = {Weidner, Karl and Kaspar, Michael and Seliger, Norbert}, title = {Innovative Leistungsmodule}, series = {Produktion von Leiterplatten und Systemen (PLUS)}, booktitle = {Produktion von Leiterplatten und Systemen (PLUS)}, pages = {1408 -- 1412}, year = {2011}, language = {de} } @article{WirthSchutter2011, author = {Wirth, Heike and Schutter, Sabina}, title = {Versorger und Verlierer}, series = {DJI Impuls}, volume = {2011}, journal = {DJI Impuls}, number = {01}, organization = {Deutsches Jugendinstitut e. V.}, pages = {28 -- 30}, year = {2011}, abstract = {Das traditionelle Ern{\"a}hrermodell wird seltener. Vor allem junge Frauen arbeiten genausoviel wie ihre Partner. Doch sind Kinder da, steigen die M{\"u}tter ganz oder teilweise aus dem Erwerbsleben aus - mit erheblichen Risiken f{\"u}r ihre Alterssicherung.}, language = {de} }