@inproceedings{SteidlRiedhammerBockletetal.2011, author = {Steidl, Stefan and Riedhammer, Korbinian and Bocklet, Tobias and H{\"o}nig, Florian and N{\"o}th, Elmar}, title = {Java Visual Speech Components for Rapid Application Development of GUI based Speech Processing Applications}, series = {INTERSPEECH 2011, 12th Annual Conference of the International Speech Communication Association, Florence, Italy, August 2011.}, booktitle = {INTERSPEECH 2011, 12th Annual Conference of the International Speech Communication Association, Florence, Italy, August 2011.}, pages = {3257 -- 3260}, year = {2011}, abstract = {In this paper, we describe a new Java framework for an easy and efficient way of developing new GUI based speech processing applications. Standard components are provided to display the speech signal, the power plot, and the spectrogram. Furthermore, a component to create a new transcription and to display and manipulate an existing transcription is provided, as well as a component to display and manually correct external pitch values. These Swing components can be easily embedded into own Java programs. They can be synchronized to display the same region of the speech file. The object-oriented design provides base classes for rapid development of own components.}, language = {en} } @article{StromeckFaderlPentlehnerKensyetal.2011, author = {Stromeck-Faderl, A. and Pentlehner, Dominik and Kensy, U. and Dick, B.}, title = {High-resolution electronic spectroscopy of the BODIPY chromophore in supersonic beam and superfluid helium droplets}, series = {CHEM-PHYS-CHEM, Special Issue: Laser Chemistry and Spectroscopy}, journal = {CHEM-PHYS-CHEM, Special Issue: Laser Chemistry and Spectroscopy}, number = {12}, year = {2011}, abstract = {We present the fluorescence excitation and dispersed emission spectra of the parent compound of the boron dipyrromethene (BODIPY) dye class measured in a supersonic beam and isolated in superfluid helium nanodroplets. The gas-phase spectrum of the isolated molecules displays many low-frequency transitions that are assigned to a symmetry-breaking mode with a strongly nonharmonic potential, presumably the out-of-plane wagging mode of the BF2 group. The data are in good agreement with transition energies and Franck-Condon factors calculated for a double minimum potential in the upper electronic state. The corresponding transitions do not appear in the helium droplet. This is explained with the quasi-rigid first layer of helium atoms attached to the dopant molecule by van der Waals forces. The spectral characteristics are those of a cyanine dye rather than that of an aromatic chromophore.}, language = {en} } @incollection{Versen2011, author = {Versen, Martin}, title = {DRAM Failure Analysis and Defect Localization Techniques, Microelectronics Failure Analysis}, series = {Desk Reference Sixth Edition}, booktitle = {Desk Reference Sixth Edition}, publisher = {ASM International}, address = {Ohio}, publisher = {Technische Hochschule Rosenheim}, year = {2011}, abstract = {Comprehensive guide to the process and test methods used for electronic device failure analysis. Contains dozens of articles—contributed by industry experts—covering a wide range of topics involving the failure analysis of microelectronics. It places the most important and up-to-date information on this subject at your fingertips.  Topic coverage includes:  Failure Analysis Process Flow Failure Verification  Failure Modes and Failure Classification  Special Devices (MEMS, Optoelectronics, Passives)  Fault Localization Techniques: Package Level (NDT)  Die Level (Depackaging, Photon Emission, Microthermography, Laser-Based Methods, Particle Beam Methods)  Deprocessing \& Imaging Techniques: Deprocessing  General Imaging Techniques  Local Deprocessing \& Imaging  Circuit Edit and Design Modification  Material Analysis Techniques  Reference Information: Important Topics for Semiconductor Devices  Failure Analysis Techniques Roadmap  Failure Analysis Operations and Management  Appendices: Failure Analysis Terms, Definitions, and Acronyms  Industry Standards}, language = {en} } @inproceedings{Versen2011, author = {Versen, Martin}, title = {Worst Case Test Conditions for Defect Localization in DRAM Devices}, series = {Microelectronics Seminar of the ISTFA 2011}, booktitle = {Microelectronics Seminar of the ISTFA 2011}, year = {2011}, language = {en} } @inproceedings{VersenShankarEnimidisettyetal.2011, author = {Versen, Martin and Shankar, S. and Enimidisetty, S. and Bernhardt, A. and Srinivasan, B.}, title = {Setup for Locating PV-Cell Surface Defects Through ISC Measurements}, series = {Proceedings of the 37th ISTFA 2011}, booktitle = {Proceedings of the 37th ISTFA 2011}, year = {2011}, language = {en} } @inproceedings{WeidnerKasparSeliger2011, author = {Weidner, Karl and Kaspar, Michael and Seliger, Norbert}, title = {Innovative Leistungsmodule}, series = {Produktion von Leiterplatten und Systemen (PLUS)}, booktitle = {Produktion von Leiterplatten und Systemen (PLUS)}, pages = {1408 -- 1412}, year = {2011}, language = {de} } @article{WirthSchutter2011, author = {Wirth, Heike and Schutter, Sabina}, title = {Versorger und Verlierer}, series = {DJI Impuls}, volume = {2011}, journal = {DJI Impuls}, number = {01}, organization = {Deutsches Jugendinstitut e. V.}, pages = {28 -- 30}, year = {2011}, abstract = {Das traditionelle Ern{\"a}hrermodell wird seltener. Vor allem junge Frauen arbeiten genausoviel wie ihre Partner. Doch sind Kinder da, steigen die M{\"u}tter ganz oder teilweise aus dem Erwerbsleben aus - mit erheblichen Risiken f{\"u}r ihre Alterssicherung.}, language = {de} }