@article{AckermannGutewortQuinqueetal.2010, author = {Ackermann, N and Gutewort, V. and Quinque, M. and K{\"u}hne, M. and Stein v. Kamienski, E. and Schulze, Achim and Wichtendahl, R.}, title = {Final testing: a secure release gate towards module manufacturing}, series = {Photovoltaics International}, journal = {Photovoltaics International}, number = {8}, year = {2010}, language = {en} }