@article{CastellazziKrausSeligeretal.2002, author = {Castellazzi, A. and Kraus, R. and Seliger, Norbert and Schmitt-Landsiedel, D.}, title = {Reliability analysis of power MOSFET's with the help of compact models and circuit simulation}, series = {Microelectronics Reliability}, volume = {42}, journal = {Microelectronics Reliability}, number = {9}, issn = {0026-2714}, doi = {10.1016/S0026-2714(02)00198-1}, pages = {1605 -- 1610}, year = {2002}, language = {en} } @inproceedings{CastellazziKrausSeligeretal.2003, author = {Castellazzi, A. and Kraus, R. and Seliger, Norbert and Schmitt-Landsiedel, D.}, title = {Influence of parasitic inductances on the switching behaviour of Power MOSFETs used in automotive applications}, series = {Proc. 10th European Conference on Power Electronics and Applications, EPE}, volume = {10}, booktitle = {Proc. 10th European Conference on Power Electronics and Applications, EPE}, year = {2003}, language = {en} } @article{CastellazziKartalKrausetal.2003, author = {Castellazzi, A. and Kartal, V. and Kraus, R. and Seliger, Norbert and Honsberg-Riedl, M. and Schmitt-Landsiedel, D.}, title = {Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's}, series = {Microelectronics Reliability}, volume = {43}, journal = {Microelectronics Reliability}, number = {9}, issn = {0026-2714}, doi = {10.1016/S0026-2714(03)00319-6}, pages = {1877 -- 1882}, year = {2003}, language = {en} }