@inproceedings{RoehrichHirschSeliger2004, author = {R{\"o}hrich, A. and Hirsch, H. and Seliger, Norbert}, title = {EMC-optimised design of a converter power stage by reduction of surface currents}, series = {IEEE 35th Annual Power Electronics Specialists Conference (IEEE Cat. No.04CH37551)}, booktitle = {IEEE 35th Annual Power Electronics Specialists Conference (IEEE Cat. No.04CH37551)}, publisher = {IEEE}, pages = {82 -- 85}, year = {2004}, language = {en} } @inproceedings{GerberFerreiraHofsajeretal.2004, author = {Gerber, M. and Ferreira, J.A. and Hofsajer, I.W. and Seliger, Norbert}, title = {Interleaving optimization in synchronous rectified DC/DC converters}, series = {IEEE 35th Annual Power Electronics Specialists Conference (IEEE Cat. No.04CH37551)}, booktitle = {IEEE 35th Annual Power Electronics Specialists Conference (IEEE Cat. No.04CH37551)}, publisher = {IEEE}, pages = {4655 -- 4661}, year = {2004}, language = {en} } @inproceedings{GerberFerreiraHofsajeretal.2005, author = {Gerber, M. and Ferreira, J.A. and Hofsajer, I.W. and Seliger, Norbert}, title = {Integral design of a high power density DC/DC converter for harsh environments}, series = {European Conference on Power Electronics and Applications}, booktitle = {European Conference on Power Electronics and Applications}, publisher = {IEEE}, year = {2005}, language = {en} } @article{GerberFerreiraSeligeretal.2005, author = {Gerber, M. and Ferreira, J.A. and Seliger, Norbert and Hofsajer, I.W.}, title = {High density packaging of the passive components in an automotive DC/DC converter}, series = {IEEE Transactions on Power Electronics}, volume = {20}, journal = {IEEE Transactions on Power Electronics}, number = {2}, publisher = {IEEE}, pages = {268 -- 275}, year = {2005}, language = {en} } @inproceedings{GerberFerreiraSeligeretal.2005, author = {Gerber, M. and Ferreira, J.A. and Seliger, Norbert and Hofsajer, I.W.}, title = {Design and evaluation of an automotive integrated system module}, series = {Conference Record of the 2005 Industry Applications Conference}, booktitle = {Conference Record of the 2005 Industry Applications Conference}, publisher = {IEEE}, pages = {1144 -- 1151}, year = {2005}, language = {en} } @inproceedings{RenkenEhbauerKarreretal.2007, author = {Renken, F. and Ehbauer, G. and Karrer, V. and Knorr, R. and Ramminger, S. and Seliger, Norbert and Wolfgang, E.}, title = {Reliability of high temperature inverters for HEV}, series = {Proceedings Power Conversion Conference}, booktitle = {Proceedings Power Conversion Conference}, publisher = {IEEE}, address = {Nagoya}, doi = {10.1109/PCCON.2007.373022}, pages = {563 -- 568}, year = {2007}, language = {en} } @article{GerberFerreiraSeligeretal.2005, author = {Gerber, M. and Ferreira, J.A. and Seliger, Norbert and Hofsajer, I.W.}, title = {Integral 3-D thermal, electrical and mechanical design of an automotive DC/DC converter}, series = {IEEE Transactions on Power Electronics}, volume = {20}, journal = {IEEE Transactions on Power Electronics}, number = {3}, publisher = {IEEE}, pages = {566 -- 575}, year = {2005}, language = {en} } @article{FuerboeckPoganyLitzenbergeretal.2000, author = {F{\"u}rb{\"o}ck, C. and Pogany, D. and Litzenberger, M. and Gornik, E. and Seliger, Norbert and Gossner, H. and M{\"u}ller-Lynch, T. and Stecher, M. and Werner, W.}, title = {Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices}, series = {Journal of Electrostatics}, volume = {49}, journal = {Journal of Electrostatics}, pages = {195 -- 213}, year = {2000}, language = {en} } @inproceedings{GerstenmaierWachutkaSeliger2002, author = {Gerstenmaier, Y.C. and Wachutka, G. and Seliger, Norbert}, title = {Efficient calculation of transient temperature fields responding to fast changing heatsources over long duration in high frequency DC/DC converter}, series = {Proceedings of THERMINIC}, booktitle = {Proceedings of THERMINIC}, pages = {297 -- 302}, year = {2002}, language = {en} } @inproceedings{FuerboeckPoganyLitzenbergeretal.1999, author = {F{\"u}rb{\"o}ck, C. and Pogany, D. and Litzenberger, M. and Gornik, E. and Seliger, Norbert and Gossner, H. and M{\"u}ller-Lynch, T. and Stecher, M. and Werner, W.}, title = {Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices}, series = {Electrical Overstress/Electrostatic Discharge Symposium Proceedings}, booktitle = {Electrical Overstress/Electrostatic Discharge Symposium Proceedings}, publisher = {IEEE}, doi = {10.1109/EOSESD.1999.819067}, pages = {241 -- 250}, year = {1999}, language = {en} } @inproceedings{SeligerRammingerFrankeetal.2000, author = {Seliger, Norbert and Ramminger, S. and Franke, T. and Wachutka, G.}, title = {A study of heel crack failures in wire bonds under mechanical cycling}, series = {Proceedings of Micromat 2000}, booktitle = {Proceedings of Micromat 2000}, year = {2000}, language = {en} } @inproceedings{FuerboeckThalhammerLitzenbergeretal.1999, author = {F{\"u}rb{\"o}ck, C. and Thalhammer, R. and Litzenberger, M. and Seliger, Norbert and Pogany, D. and Gornik, E. and Wachutka, G.}, title = {A differential backside laserprobing technique for the investigation of the lateral temperature distribution in power devices}, series = {11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings}, booktitle = {11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings}, publisher = {IEEE}, doi = {10.1109/ISPSD.1999.764095}, pages = {193 -- 196}, year = {1999}, language = {en} } @article{SeligerFaltlhauser2023, author = {Seliger, Norbert and Faltlhauser, Georg}, title = {Progressive Expansion Sampling of Quasi-Static Magnetic Fields in Unconfined Regions}, series = {IEEE Transactions on Components, Packaging and Manufacturing Technology}, journal = {IEEE Transactions on Components, Packaging and Manufacturing Technology}, doi = {10.1109/TCPMT.2023.3283285}, pages = {9}, year = {2023}, abstract = {We present a fast and accurate measurement technique for quasi-static magnetic fields by employing a progressive sampling method in an unconfined input space. The proposed machine learning algorithm is tested against uniform sampling on printed circuit board test structures and a buck converter. We prove allocation of multiple, separated regions with predefined lateral field limits at MHz frequencies. The feasibility of equivalent magnetic dipole source modeling based on a small number of samples is demonstrated. Compared to uniform testing, progressive expansion sampling identifies contours of given field limits in less than 3\% of the reference measurement time.}, language = {en} } @inproceedings{OilaCiappaSeligeretal.2003, author = {Oila, K. and Ciappa, M. and Seliger, Norbert and Fichtner, W.}, title = {Thermal Modeling, Simulation and Characterization of a High-Temperature Converter for Automotive Applications}, series = {Proc. 10th European Conference on Power Electronics and Applications, EPE}, volume = {10}, booktitle = {Proc. 10th European Conference on Power Electronics and Applications, EPE}, year = {2003}, language = {en} } @inproceedings{CastellazziKrausSeligeretal.2003, author = {Castellazzi, A. and Kraus, R. and Seliger, Norbert and Schmitt-Landsiedel, D.}, title = {Influence of parasitic inductances on the switching behaviour of Power MOSFETs used in automotive applications}, series = {Proc. 10th European Conference on Power Electronics and Applications, EPE}, volume = {10}, booktitle = {Proc. 10th European Conference on Power Electronics and Applications, EPE}, year = {2003}, language = {en} } @inproceedings{OilaCiappaSeligeretal.2003, author = {Oila, Kari and Ciappa, Mauro and Seliger, Norbert and Fichtner, Wolfgang}, title = {Computer assisted thermal design of an integrated starter generator and model assessment under realistic operating conditions}, series = {International Workshop on Thermal Investigation of ICs and Systems (THERMINIC)}, booktitle = {International Workshop on Thermal Investigation of ICs and Systems (THERMINIC)}, isbn = {978-2-84813-020-0}, pages = {107 -- 112}, year = {2003}, language = {en} } @article{PoganySeligerLitzenbergeretal.1999, author = {Pogany, D. and Seliger, Norbert and Litzenberger, M. and Gossner, H. and Stecher, M. and M{\"u}ller-Lynch, T. and Werner, W. and Gornik, E.}, title = {Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices}, series = {Microelectronics Reliability}, volume = {39}, journal = {Microelectronics Reliability}, number = {6}, issn = {0026-2714}, doi = {10.1016/S0026-2714(99)00162-6}, pages = {1143 -- 1148}, year = {1999}, language = {en} } @inproceedings{WolfgangSeligerLugertetal.2002, author = {Wolfgang, E and Seliger, Norbert and Lugert, G and Riepl, T}, title = {High-temperature power electronics: challenges and opportunities}, series = {Proceedings of the 2nd International Conference on Integrated Power Systems (CIPS)}, booktitle = {Proceedings of the 2nd International Conference on Integrated Power Systems (CIPS)}, pages = {43 -- 51}, year = {2002}, language = {en} } @article{SeligerWolfgangLefrancetal.2002, author = {Seliger, Norbert and Wolfgang, E. and Lefranc, G. and Berg, H. and Licht, T.}, title = {Reliable power electronics for automotive applications}, series = {Microelectronics Reliability}, volume = {42}, journal = {Microelectronics Reliability}, number = {9-11}, issn = {0026-2714}, doi = {10.1016/S0026-2714(02)00197-X}, pages = {1597 -- 1604}, year = {2002}, language = {en} } @article{FuerboeckLitzenbergerPoganyetal.1999, author = {F{\"u}rb{\"o}ck, C. and Litzenberger, M. and Pogany, D. and Gornik, E. and Seliger, Norbert and M{\"u}ller-Lynch, T. and Stecher, M. and Goßner, H. and Werner, W.}, title = {Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress}, series = {Microelectronics Reliability}, volume = {39}, journal = {Microelectronics Reliability}, number = {6}, issn = {0026-2714}, doi = {10.1016/S0026-2714(99)00124-9}, pages = {925 -- 930}, year = {1999}, language = {en} } @article{RammingerSeligerWachutka2000, author = {Ramminger, S. and Seliger, Norbert and Wachutka, G.}, title = {Reliability model for Al wire bonds subjected to heel crack failures}, series = {Microelectronics Reliability}, volume = {40}, journal = {Microelectronics Reliability}, number = {8}, issn = {0026-2714}, doi = {10.1016/S0026-2714(00)00139-6}, pages = {1521 -- 1525}, year = {2000}, language = {en} } @article{CastellazziKrausSeligeretal.2002, author = {Castellazzi, A. and Kraus, R. and Seliger, Norbert and Schmitt-Landsiedel, D.}, title = {Reliability analysis of power MOSFET's with the help of compact models and circuit simulation}, series = {Microelectronics Reliability}, volume = {42}, journal = {Microelectronics Reliability}, number = {9}, issn = {0026-2714}, doi = {10.1016/S0026-2714(02)00198-1}, pages = {1605 -- 1610}, year = {2002}, language = {en} } @article{CastellazziKartalKrausetal.2003, author = {Castellazzi, A. and Kartal, V. and Kraus, R. and Seliger, Norbert and Honsberg-Riedl, M. and Schmitt-Landsiedel, D.}, title = {Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's}, series = {Microelectronics Reliability}, volume = {43}, journal = {Microelectronics Reliability}, number = {9}, issn = {0026-2714}, doi = {10.1016/S0026-2714(03)00319-6}, pages = {1877 -- 1882}, year = {2003}, language = {en} } @article{CoqueryLefrancLichtetal.2003, author = {Coquery, G. and Lefranc, G. and Licht, T. and Lallemand, R. and Seliger, Norbert and Berg, H.}, title = {High temperature reliability on automotive power modules verified by power cycling tests up to 150°C}, series = {Microelectronics Reliability}, volume = {43}, journal = {Microelectronics Reliability}, number = {9}, issn = {0026-2714}, doi = {10.1016/S0026-2714(03)00318-4}, pages = {1871 -- 1876}, year = {2003}, language = {en} } @article{GerberFerreiraHofsajeretal.2002, author = {Gerber, M. and Ferreira, J.A. and Hofsajer, I.W. and Seliger, Norbert}, title = {A volumetric optimization of a low-pass filter}, series = {IEEE Transactions on Industry Applications}, volume = {38}, journal = {IEEE Transactions on Industry Applications}, number = {5}, issn = {1939-9367}, doi = {10.1109/TIA.2002.802996}, pages = {1432 -- 1440}, year = {2002}, language = {en} } @article{KanertDettmerPlikatetal.2003, author = {Kanert, W. and Dettmer, H. and Plikat, B. and Seliger, Norbert}, title = {Reliability aspects of semiconductor devices in high temperature applications}, series = {Microelectronics Reliability}, volume = {43}, journal = {Microelectronics Reliability}, number = {9}, issn = {0026-2714}, doi = {10.1016/S0026-2714(03)00313-5}, pages = {1839 -- 1846}, year = {2003}, language = {en} } @inproceedings{GerberFerreiraHofsajeretal.2002, author = {Gerber, M. and Ferreira, J.A. and Hofsajer, I.W. and Seliger, Norbert}, title = {High density packaging of the passive components in an automotive DC/DC converter}, series = {2002 IEEE 33rd Annual IEEE Power Electronics Specialists Conference. Proceedings (Cat. No.02CH37289)}, volume = {2}, booktitle = {2002 IEEE 33rd Annual IEEE Power Electronics Specialists Conference. Proceedings (Cat. No.02CH37289)}, doi = {10.1109/PSEC.2002.1022545}, pages = {761 -- 767}, year = {2002}, language = {en} } @article{GerberSeligerFerreiraetal.2006, author = {Gerber, M. and Seliger, Norbert and Ferreira, J. A. and Hofsajer, I. W.}, title = {Magnetic component miniaturisation for application in power electronic modules}, series = {4th International Conference on Integrated Power Systems}, journal = {4th International Conference on Integrated Power Systems}, pages = {1 -- 6}, year = {2006}, language = {en} } @article{PoganySeligerLalinskyetal.1998, author = {Pogany, D. and Seliger, Norbert and Lalinsky, T. and Kuzmik, J. and Habas, P. and Hrkut, P. and Gornik, E.}, title = {Study of Thermal Effects in GaAs Micromachined Power Sensor Microsystems by an Optical Interferometer Technique}, series = {Microelectronics Journal}, volume = {29}, journal = {Microelectronics Journal}, number = {4-5}, doi = {10.1016/S0026-2692(97)00057-8}, pages = {191 -- 198}, year = {1998}, language = {en} } @inproceedings{ThalhammerFuerboeckSeligeretal.1998, author = {Thalhammer, R. and Fuerboeck, C. and Seliger, Norbert and Deboy, G. and Gornik, E. and Wachutka, G.}, title = {Internal characterization of IGBTs using the backside laser probing technique - Interpretation of measurement by numerical simulation}, series = {Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs (Proc. of ISPSD)}, booktitle = {Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs (Proc. of ISPSD)}, doi = {10.1109/ISPSD.1998.702668}, pages = {199 -- 202}, year = {1998}, language = {en} } @article{SeligerGornikPoganyetal.1998, author = {Seliger, Norbert and Gornik, E. and Pogany, D. and Fuerboeck, C. and Habas, P. and Thalhammer, R. and Stoisiek, M.}, title = {Characterisation of Semiconductor Devices by Infrared Laser Interferometry}, series = {E\&I Elektrotechnik und Informationstechnik, Sonderheft Trends in der Mikrotechnik}, journal = {E\&I Elektrotechnik und Informationstechnik, Sonderheft Trends in der Mikrotechnik}, number = {7-8}, doi = {10.1007/BF03159611}, pages = {403 -- 403}, year = {1998}, language = {en} } @inproceedings{ThalhammerFuerboeckSeligeretal.1998, author = {Thalhammer, R. and Fuerboeck, C. and Seliger, Norbert and Gornik, E. and Wachutka, G.}, title = {Validation and calibration of Electrothermal Device Models Using Infrared Laser Probing Techniques}, series = {Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems (Proc. of MSM'98)}, booktitle = {Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems (Proc. of MSM'98)}, pages = {213 -- 217}, year = {1998}, language = {en} } @article{PoganySeligerGorniketal.1998, author = {Pogany, D. and Seliger, Norbert and Gornik, E. and Stoisiek, M. and Lalinsky, T.}, title = {Analysis of the temperature evolution from the time resolved thermo-optical interferometric measurements with few Fabry-Perot peaks}, series = {Journal of Applied Physics}, volume = {84}, journal = {Journal of Applied Physics}, number = {8}, doi = {10.1063/1.368674}, pages = {4495 -- 4501}, year = {1998}, language = {en} } @article{FuerboeckSeligerPoganyetal.1998, author = {Fuerboeck, C. and Seliger, Norbert and Pogany, D. and Litzenberger, M. and Gornik, E. and Stecher, M. and Gosser, H. and Werner, W.}, title = {Backside laserprober characterization of thermal effects during high current stress in smart power ESD protection devices}, series = {International Electron Devices Meeting (IEDM '98) Technical Digest}, journal = {International Electron Devices Meeting (IEDM '98) Technical Digest}, doi = {10.1109/IEDM.1998.746451}, pages = {691 -- 694}, year = {1998}, language = {en} } @incollection{SeligerFuerboeckHabasetal.1997, author = {Seliger, Norbert and Fuerboeck, C. and Habas, P. and Pogany, D. and Gornik, E.}, title = {Backside-Laserprober Technique for Characterisation of Semiconductor Power Devices}, series = {Proceedings of the Seminar Basics and Technology of Electronic Devices}, booktitle = {Proceedings of the Seminar Basics and Technology of Electronic Devices}, publisher = {Technische Hochschule Rosenheim}, pages = {143 -- 147}, year = {1997}, language = {en} } @article{SeligerHabasPoganyetal.1997, author = {Seliger, Norbert and Habas, P. and Pogany, D. and Gornik, E.}, title = {Time-Resolved Analysis of Self-Heating in Power VDMOSFETs Using Backside-Laserprobing}, series = {Solid-State Electronics}, volume = {41}, journal = {Solid-State Electronics}, number = {9}, doi = {10.1016/S0038-1101(97)00131-7}, pages = {1285 -- 1292}, year = {1997}, language = {en} } @inproceedings{PoganyFuerboeckSeligeretal.1997, author = {Pogany, D. and Fuerboeck, C. and Seliger, Norbert and Habas, P. and Gornik, E. and Kubicek, S. and Decoutere, S.}, title = {Optical Testing of submicron-technology MOSFETs and bipolar transistors}, series = {European Solid-State Device Research Conference (ESSDERC' 97)}, booktitle = {European Solid-State Device Research Conference (ESSDERC' 97)}, editor = {Gr{\"u}nbacher, H.}, pages = {372 -- 375}, year = {1997}, language = {en} } @inproceedings{SeligerPoganyFuerboecketal.1997, author = {Seliger, Norbert and Pogany, D. and Fuerboeck, C. and Habas, P. and Gornik, E. and Stoisiek, M.}, title = {A study of temperature distribution in SOI-smart power devices in transient conditions by optical interferometry}, series = {27th European Solid-State Device Research Conference (ESSDERC' 97)}, booktitle = {27th European Solid-State Device Research Conference (ESSDERC' 97)}, editor = {Gr{\"u}nbacher, H.}, pages = {372 -- 375}, year = {1997}, language = {en} } @article{SeligerPoganyFuerboecketal.1997, author = {Seliger, Norbert and Pogany, D. and Fuerboeck, C. and Habas, P. and Gornik, E.}, title = {A laser beam method for evaluation of thermal time constant in smart power devices}, series = {Microelectronics Reliability}, volume = {37}, journal = {Microelectronics Reliability}, number = {10/11}, doi = {10.1016/S0026-2714(97)00149-2}, pages = {1727 -- 1730}, year = {1997}, language = {en} } @inproceedings{FuerboeckThalhammerSeligeretal.1997, author = {Fuerboeck, C. and Thalhammer, R. and Seliger, Norbert and Pogany, D. and Deboy, G. and Wachutka, G. and Gornik, E.}, title = {Lokale Temperaturbestimmung in Insulated Gate Bipolar Transistoren (IGBTs) mittels Lasersondentechnik}, series = {Beitr{\"a}ge der Informationstagung ME 97 OVE-Schriftenreihe; Nr. 14 (ISBN 3-85133-010-2)}, volume = {14}, booktitle = {Beitr{\"a}ge der Informationstagung ME 97 OVE-Schriftenreihe; Nr. 14 (ISBN 3-85133-010-2)}, pages = {117 -- 122}, year = {1997}, language = {en} } @inproceedings{SeligerHabasKoecketal.1996, author = {Seliger, Norbert and Habas, P. and Koeck, A. and Pogany, D. and Gornik, E.}, title = {Backside laserprobing of transient heating in power VDMOSFETs}, series = {International Seminar on Power Semiconductors (ISPS)}, booktitle = {International Seminar on Power Semiconductors (ISPS)}, pages = {115 -- 122}, year = {1996}, language = {en} } @article{SeligerHabašGornik1996, author = {Seliger, Norbert and Habaš, Predrag and Gornik, Erich}, title = {A study of backside laser-probe signals in MOSFETs}, series = {Microelectronic Engineering}, volume = {31}, journal = {Microelectronic Engineering}, number = {1-4}, doi = {10.1016/0167-9317(95)00329-0}, pages = {87 -- 94}, year = {1996}, language = {en} } @inproceedings{BurianPoganyLalinskyetal.1997, author = {Burian, E. and Pogany, D. and Lalinsky, T. and Seliger, Norbert and Gornik, E.}, title = {Thermal Simulation and characterization of GaAs micromachined power sensor microsystems}, series = {Eurosensors XI}, booktitle = {Eurosensors XI}, pages = {949 -- 952}, year = {1997}, language = {en} } @inproceedings{SeligerHabasGornik1996, author = {Seliger, Norbert and Habas, P. and Gornik, E.}, title = {Time Domain Characterization of lattice heating in power VDMOSFETs by means of an interferometric laserprobe technique}, series = {Proceedings of the 26th European Solid State Device Research Conference (ESSDERC' 96)}, booktitle = {Proceedings of the 26th European Solid State Device Research Conference (ESSDERC' 96)}, editor = {Baccarani, G. and Rudan, M.}, pages = {847 -- 850}, year = {1996}, language = {en} } @inproceedings{PoganySeligerLalinskyetal.1996, author = {Pogany, D. and Seliger, Norbert and Lalinsky, T. and Kuzmik, J. and Habas, P. and Hrkut, P. and Gornik, E.}, title = {Study of thermal effects in GaAs micromachined power sensor microsystems by an optical interferometer technique}, series = {International Workshop on Thermal Investigation of ICs and Systems (THERMINIC' 96)}, booktitle = {International Workshop on Thermal Investigation of ICs and Systems (THERMINIC' 96)}, pages = {185 -- 190}, year = {1996}, language = {en} } @inproceedings{SeligerHabasGornik1995, author = {Seliger, Norbert and Habas, P. and Gornik, E.}, title = {Modeling and measurements of backside laserprobe signals in MOSFETs}, series = {European Conference on Solid-State Device Research (ESSDERC' 95)}, booktitle = {European Conference on Solid-State Device Research (ESSDERC' 95)}, editor = {de Graaf, H. C. and van Kranenburg, H.}, pages = {773 -- 776}, year = {1995}, language = {en} } @inproceedings{PoganyLalinskySeligeretal.1996, author = {Pogany, D. and Lalinsky, T. and Seliger, Norbert and Kuzmik, J. and Habas, P. and Hrkut, P. and Gornik, E.}, title = {Power Sensor Microsystems Characterization using a contactless optical laser method}, series = {International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM' 96)}, booktitle = {International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM' 96)}, pages = {201 -- 204}, year = {1996}, language = {en} } @inproceedings{Seliger2023, author = {Seliger, Norbert}, title = {A Differential Relaxation Half-Bridge Oscillator for Inductive Power Transfer}, series = {Proceedings PCIM Europe 2023}, booktitle = {Proceedings PCIM Europe 2023}, publisher = {Mesago GmbH}, address = {N{\"u}rnberg}, pages = {7}, year = {2023}, abstract = {We present inductive power transfer (IPT) with a half-bridge converter based on differential relaxation self-oscillation. The oscillation dynamics of the converter automatically adapts to variation in the inductive coupling link and changes in the load, respectively. Design equations based on theoretical circuit analysis reveals a high power transfer efficiency (>90\%) for alteration of coupling distance in the strong coupling regime. A prototype system employing GaN-HEMTs confirms the theoretically predicted characteristics of the proposed circuit.}, language = {en} } @inproceedings{Seliger2022, author = {Seliger, Norbert}, title = {A Differential Relaxation Oscillator for Inductive Power Transfer}, series = {2022 IEEE Industrial Electronics and Applications Conference (IEACon)}, booktitle = {2022 IEEE Industrial Electronics and Applications Conference (IEACon)}, publisher = {IEEE}, pages = {1 -- 6}, year = {2022}, abstract = {We present a novel differential relaxation oscillator for inductive power transfer. The proposed oscillator offers an automatic adaption of the oscillation period to a change in the power link impedance, which ensures a high efficient operation for variable loads and coupling factors. A detailed circuit model of the self-oscillation system is provided with analytical design equations. We find a large self-oscillation range for variable coupling factors and loads. The theoretical results are confirmed by circuit simulation and measurements carried out on a low-power demonstrator system. We demonstrate non-resonant and robust self-adaption of the relaxation oscillator to coupling factors ranging from k=0.6-0.9.}, language = {en} } @inproceedings{Seliger2022, author = {Seliger, Norbert}, title = {Self-Oscillating Capacitive Power Transfer with Multiple Receiver Capability and Coupling Path Adaption}, series = {Proceedings 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe)}, booktitle = {Proceedings 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe)}, publisher = {EPE}, organization = {Labor f{\"u}r Leistungselektronik und EMV, TH Rosenheim}, pages = {6}, year = {2022}, language = {en} }