@article{GerberFerreiraHofsajeretal.2004, author = {Gerber, M. and Ferreira, J.A. and Hofsajer, I.W. and Seliger, Norbert}, title = {A high-density heat-sink-mounted inductor for automotive applications}, series = {IEEE Transactions on Industry Applications}, volume = {40}, journal = {IEEE Transactions on Industry Applications}, number = {4}, publisher = {IEEE}, pages = {1031 -- 1038}, year = {2004}, language = {en} } @article{GerberFerreiraSeligeretal.2005, author = {Gerber, M. and Ferreira, J.A. and Seliger, Norbert and Hofsajer, I.W.}, title = {High density packaging of the passive components in an automotive DC/DC converter}, series = {IEEE Transactions on Power Electronics}, volume = {20}, journal = {IEEE Transactions on Power Electronics}, number = {2}, publisher = {IEEE}, pages = {268 -- 275}, year = {2005}, language = {en} } @article{GerberFerreiraSeligeretal.2005, author = {Gerber, M. and Ferreira, J.A. and Seliger, Norbert and Hofsajer, I.W.}, title = {Integral 3-D thermal, electrical and mechanical design of an automotive DC/DC converter}, series = {IEEE Transactions on Power Electronics}, volume = {20}, journal = {IEEE Transactions on Power Electronics}, number = {3}, publisher = {IEEE}, pages = {566 -- 575}, year = {2005}, language = {en} } @article{FuerboeckPoganyLitzenbergeretal.2000, author = {F{\"u}rb{\"o}ck, C. and Pogany, D. and Litzenberger, M. and Gornik, E. and Seliger, Norbert and Gossner, H. and M{\"u}ller-Lynch, T. and Stecher, M. and Werner, W.}, title = {Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices}, series = {Journal of Electrostatics}, volume = {49}, journal = {Journal of Electrostatics}, pages = {195 -- 213}, year = {2000}, language = {en} } @article{SeligerFaltlhauser2023, author = {Seliger, Norbert and Faltlhauser, Georg}, title = {Progressive Expansion Sampling of Quasi-Static Magnetic Fields in Unconfined Regions}, series = {IEEE Transactions on Components, Packaging and Manufacturing Technology}, journal = {IEEE Transactions on Components, Packaging and Manufacturing Technology}, doi = {10.1109/TCPMT.2023.3283285}, pages = {9}, year = {2023}, abstract = {We present a fast and accurate measurement technique for quasi-static magnetic fields by employing a progressive sampling method in an unconfined input space. The proposed machine learning algorithm is tested against uniform sampling on printed circuit board test structures and a buck converter. We prove allocation of multiple, separated regions with predefined lateral field limits at MHz frequencies. The feasibility of equivalent magnetic dipole source modeling based on a small number of samples is demonstrated. Compared to uniform testing, progressive expansion sampling identifies contours of given field limits in less than 3\% of the reference measurement time.}, language = {en} } @article{PoganySeligerLitzenbergeretal.1999, author = {Pogany, D. and Seliger, Norbert and Litzenberger, M. and Gossner, H. and Stecher, M. and M{\"u}ller-Lynch, T. and Werner, W. and Gornik, E.}, title = {Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices}, series = {Microelectronics Reliability}, volume = {39}, journal = {Microelectronics Reliability}, number = {6}, issn = {0026-2714}, doi = {10.1016/S0026-2714(99)00162-6}, pages = {1143 -- 1148}, year = {1999}, language = {en} } @article{SeligerWolfgangLefrancetal.2002, author = {Seliger, Norbert and Wolfgang, E. and Lefranc, G. and Berg, H. and Licht, T.}, title = {Reliable power electronics for automotive applications}, series = {Microelectronics Reliability}, volume = {42}, journal = {Microelectronics Reliability}, number = {9-11}, issn = {0026-2714}, doi = {10.1016/S0026-2714(02)00197-X}, pages = {1597 -- 1604}, year = {2002}, language = {en} } @article{FuerboeckLitzenbergerPoganyetal.1999, author = {F{\"u}rb{\"o}ck, C. and Litzenberger, M. and Pogany, D. and Gornik, E. and Seliger, Norbert and M{\"u}ller-Lynch, T. and Stecher, M. and Goßner, H. and Werner, W.}, title = {Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress}, series = {Microelectronics Reliability}, volume = {39}, journal = {Microelectronics Reliability}, number = {6}, issn = {0026-2714}, doi = {10.1016/S0026-2714(99)00124-9}, pages = {925 -- 930}, year = {1999}, language = {en} } @article{RammingerSeligerWachutka2000, author = {Ramminger, S. and Seliger, Norbert and Wachutka, G.}, title = {Reliability model for Al wire bonds subjected to heel crack failures}, series = {Microelectronics Reliability}, volume = {40}, journal = {Microelectronics Reliability}, number = {8}, issn = {0026-2714}, doi = {10.1016/S0026-2714(00)00139-6}, pages = {1521 -- 1525}, year = {2000}, language = {en} } @article{CastellazziKrausSeligeretal.2002, author = {Castellazzi, A. and Kraus, R. and Seliger, Norbert and Schmitt-Landsiedel, D.}, title = {Reliability analysis of power MOSFET's with the help of compact models and circuit simulation}, series = {Microelectronics Reliability}, volume = {42}, journal = {Microelectronics Reliability}, number = {9}, issn = {0026-2714}, doi = {10.1016/S0026-2714(02)00198-1}, pages = {1605 -- 1610}, year = {2002}, language = {en} } @article{CastellazziKartalKrausetal.2003, author = {Castellazzi, A. and Kartal, V. and Kraus, R. and Seliger, Norbert and Honsberg-Riedl, M. and Schmitt-Landsiedel, D.}, title = {Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's}, series = {Microelectronics Reliability}, volume = {43}, journal = {Microelectronics Reliability}, number = {9}, issn = {0026-2714}, doi = {10.1016/S0026-2714(03)00319-6}, pages = {1877 -- 1882}, year = {2003}, language = {en} } @article{CoqueryLefrancLichtetal.2003, author = {Coquery, G. and Lefranc, G. and Licht, T. and Lallemand, R. and Seliger, Norbert and Berg, H.}, title = {High temperature reliability on automotive power modules verified by power cycling tests up to 150°C}, series = {Microelectronics Reliability}, volume = {43}, journal = {Microelectronics Reliability}, number = {9}, issn = {0026-2714}, doi = {10.1016/S0026-2714(03)00318-4}, pages = {1871 -- 1876}, year = {2003}, language = {en} } @article{GerberFerreiraHofsajeretal.2002, author = {Gerber, M. and Ferreira, J.A. and Hofsajer, I.W. and Seliger, Norbert}, title = {A volumetric optimization of a low-pass filter}, series = {IEEE Transactions on Industry Applications}, volume = {38}, journal = {IEEE Transactions on Industry Applications}, number = {5}, issn = {1939-9367}, doi = {10.1109/TIA.2002.802996}, pages = {1432 -- 1440}, year = {2002}, language = {en} } @article{KanertDettmerPlikatetal.2003, author = {Kanert, W. and Dettmer, H. and Plikat, B. and Seliger, Norbert}, title = {Reliability aspects of semiconductor devices in high temperature applications}, series = {Microelectronics Reliability}, volume = {43}, journal = {Microelectronics Reliability}, number = {9}, issn = {0026-2714}, doi = {10.1016/S0026-2714(03)00313-5}, pages = {1839 -- 1846}, year = {2003}, language = {en} } @article{GerberSeligerFerreiraetal.2006, author = {Gerber, M. and Seliger, Norbert and Ferreira, J. A. and Hofsajer, I. W.}, title = {Magnetic component miniaturisation for application in power electronic modules}, series = {4th International Conference on Integrated Power Systems}, journal = {4th International Conference on Integrated Power Systems}, pages = {1 -- 6}, year = {2006}, language = {en} } @article{PoganySeligerLalinskyetal.1998, author = {Pogany, D. and Seliger, Norbert and Lalinsky, T. and Kuzmik, J. and Habas, P. and Hrkut, P. and Gornik, E.}, title = {Study of Thermal Effects in GaAs Micromachined Power Sensor Microsystems by an Optical Interferometer Technique}, series = {Microelectronics Journal}, volume = {29}, journal = {Microelectronics Journal}, number = {4-5}, doi = {10.1016/S0026-2692(97)00057-8}, pages = {191 -- 198}, year = {1998}, language = {en} } @article{SeligerGornikPoganyetal.1998, author = {Seliger, Norbert and Gornik, E. and Pogany, D. and Fuerboeck, C. and Habas, P. and Thalhammer, R. and Stoisiek, M.}, title = {Characterisation of Semiconductor Devices by Infrared Laser Interferometry}, series = {E\&I Elektrotechnik und Informationstechnik, Sonderheft Trends in der Mikrotechnik}, journal = {E\&I Elektrotechnik und Informationstechnik, Sonderheft Trends in der Mikrotechnik}, number = {7-8}, doi = {10.1007/BF03159611}, pages = {403 -- 403}, year = {1998}, language = {en} } @article{PoganySeligerGorniketal.1998, author = {Pogany, D. and Seliger, Norbert and Gornik, E. and Stoisiek, M. and Lalinsky, T.}, title = {Analysis of the temperature evolution from the time resolved thermo-optical interferometric measurements with few Fabry-Perot peaks}, series = {Journal of Applied Physics}, volume = {84}, journal = {Journal of Applied Physics}, number = {8}, doi = {10.1063/1.368674}, pages = {4495 -- 4501}, year = {1998}, language = {en} } @article{FuerboeckSeligerPoganyetal.1998, author = {Fuerboeck, C. and Seliger, Norbert and Pogany, D. and Litzenberger, M. and Gornik, E. and Stecher, M. and Gosser, H. and Werner, W.}, title = {Backside laserprober characterization of thermal effects during high current stress in smart power ESD protection devices}, series = {International Electron Devices Meeting (IEDM '98) Technical Digest}, journal = {International Electron Devices Meeting (IEDM '98) Technical Digest}, doi = {10.1109/IEDM.1998.746451}, pages = {691 -- 694}, year = {1998}, language = {en} } @article{SeligerHabasPoganyetal.1997, author = {Seliger, Norbert and Habas, P. and Pogany, D. and Gornik, E.}, title = {Time-Resolved Analysis of Self-Heating in Power VDMOSFETs Using Backside-Laserprobing}, series = {Solid-State Electronics}, volume = {41}, journal = {Solid-State Electronics}, number = {9}, doi = {10.1016/S0038-1101(97)00131-7}, pages = {1285 -- 1292}, year = {1997}, language = {en} }