@article{CastellazziKartalKrausetal.2003, author = {Castellazzi, A. and Kartal, V. and Kraus, R. and Seliger, Norbert and Honsberg-Riedl, M. and Schmitt-Landsiedel, D.}, title = {Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's}, series = {Microelectronics Reliability}, volume = {43}, journal = {Microelectronics Reliability}, number = {9}, issn = {0026-2714}, doi = {10.1016/S0026-2714(03)00319-6}, pages = {1877 -- 1882}, year = {2003}, language = {en} } @article{CoqueryLefrancLichtetal.2003, author = {Coquery, G. and Lefranc, G. and Licht, T. and Lallemand, R. and Seliger, Norbert and Berg, H.}, title = {High temperature reliability on automotive power modules verified by power cycling tests up to 150°C}, series = {Microelectronics Reliability}, volume = {43}, journal = {Microelectronics Reliability}, number = {9}, issn = {0026-2714}, doi = {10.1016/S0026-2714(03)00318-4}, pages = {1871 -- 1876}, year = {2003}, language = {en} } @article{GerberFerreiraHofsajeretal.2002, author = {Gerber, M. and Ferreira, J.A. and Hofsajer, I.W. and Seliger, Norbert}, title = {A volumetric optimization of a low-pass filter}, series = {IEEE Transactions on Industry Applications}, volume = {38}, journal = {IEEE Transactions on Industry Applications}, number = {5}, issn = {1939-9367}, doi = {10.1109/TIA.2002.802996}, pages = {1432 -- 1440}, year = {2002}, language = {en} } @article{KanertDettmerPlikatetal.2003, author = {Kanert, W. and Dettmer, H. and Plikat, B. and Seliger, Norbert}, title = {Reliability aspects of semiconductor devices in high temperature applications}, series = {Microelectronics Reliability}, volume = {43}, journal = {Microelectronics Reliability}, number = {9}, issn = {0026-2714}, doi = {10.1016/S0026-2714(03)00313-5}, pages = {1839 -- 1846}, year = {2003}, language = {en} } @article{GerberSeligerFerreiraetal.2006, author = {Gerber, M. and Seliger, Norbert and Ferreira, J. A. and Hofsajer, I. W.}, title = {Magnetic component miniaturisation for application in power electronic modules}, series = {4th International Conference on Integrated Power Systems}, journal = {4th International Conference on Integrated Power Systems}, pages = {1 -- 6}, year = {2006}, language = {en} } @article{PoganySeligerLalinskyetal.1998, author = {Pogany, D. and Seliger, Norbert and Lalinsky, T. and Kuzmik, J. and Habas, P. and Hrkut, P. and Gornik, E.}, title = {Study of Thermal Effects in GaAs Micromachined Power Sensor Microsystems by an Optical Interferometer Technique}, series = {Microelectronics Journal}, volume = {29}, journal = {Microelectronics Journal}, number = {4-5}, doi = {10.1016/S0026-2692(97)00057-8}, pages = {191 -- 198}, year = {1998}, language = {en} } @article{SeligerGornikPoganyetal.1998, author = {Seliger, Norbert and Gornik, E. and Pogany, D. and Fuerboeck, C. and Habas, P. and Thalhammer, R. and Stoisiek, M.}, title = {Characterisation of Semiconductor Devices by Infrared Laser Interferometry}, series = {E\&I Elektrotechnik und Informationstechnik, Sonderheft Trends in der Mikrotechnik}, journal = {E\&I Elektrotechnik und Informationstechnik, Sonderheft Trends in der Mikrotechnik}, number = {7-8}, doi = {10.1007/BF03159611}, pages = {403 -- 403}, year = {1998}, language = {en} } @article{PoganySeligerGorniketal.1998, author = {Pogany, D. and Seliger, Norbert and Gornik, E. and Stoisiek, M. and Lalinsky, T.}, title = {Analysis of the temperature evolution from the time resolved thermo-optical interferometric measurements with few Fabry-Perot peaks}, series = {Journal of Applied Physics}, volume = {84}, journal = {Journal of Applied Physics}, number = {8}, doi = {10.1063/1.368674}, pages = {4495 -- 4501}, year = {1998}, language = {en} } @article{FuerboeckSeligerPoganyetal.1998, author = {Fuerboeck, C. and Seliger, Norbert and Pogany, D. and Litzenberger, M. and Gornik, E. and Stecher, M. and Gosser, H. and Werner, W.}, title = {Backside laserprober characterization of thermal effects during high current stress in smart power ESD protection devices}, series = {International Electron Devices Meeting (IEDM '98) Technical Digest}, journal = {International Electron Devices Meeting (IEDM '98) Technical Digest}, doi = {10.1109/IEDM.1998.746451}, pages = {691 -- 694}, year = {1998}, language = {en} } @article{SeligerHabasPoganyetal.1997, author = {Seliger, Norbert and Habas, P. and Pogany, D. and Gornik, E.}, title = {Time-Resolved Analysis of Self-Heating in Power VDMOSFETs Using Backside-Laserprobing}, series = {Solid-State Electronics}, volume = {41}, journal = {Solid-State Electronics}, number = {9}, doi = {10.1016/S0038-1101(97)00131-7}, pages = {1285 -- 1292}, year = {1997}, language = {en} }