@inproceedings{SeligerHelmbrecht2024, author = {Seliger, Norbert and Helmbrecht, Cordula}, title = {A high-frequency performance and degradation study of adhesive conductive EMI shielding tapes during High-Temperature Storage}, series = {Proccedings CIPS 2024 - 13th International Conference on Integrated Power Electronics Systems}, booktitle = {Proccedings CIPS 2024 - 13th International Conference on Integrated Power Electronics Systems}, publisher = {VDE VERLAG GMBH}, address = {D{\"u}sseldorf}, isbn = {978-3-8007-6288-0}, issn = {0341-3934}, pages = {297 -- 303}, year = {2024}, abstract = {The variation of the contact impedance of adhesive conductive EMI shielding tapes under high temperature storage (HTS) of 110degC is investigated. The adhesive tapes under test are implemented as signal return paths in microstrip lines. Changes in the ground plane impedance by adhesive deterioration are analyzed by S-parameter measurements from 1MHz to 3GHz. A circuit model for contact impedance degradation is proposed and applied in simulation of board level shielding. Contact resistance and contact capacitance are found to increase significantly after 2400h, causing a declined magnetic field shielding effectiveness by 30 dB below 500 MHz.}, language = {en} } @inproceedings{SeligerFaltlhauser2023, author = {Seliger, Norbert and Faltlhauser, Georg}, title = {Progressive Expansion Sampling of Quasi-Static Magnetic Fields for EMI Noise Detection and Equivalent Source Modeling}, series = {Proceedings EMC Europe 2023}, booktitle = {Proceedings EMC Europe 2023}, publisher = {IEEE}, address = {Krakov}, pages = {6}, year = {2023}, abstract = {We introduce a quick and accurate quasi-static magnetic field scanning technique by employing a progressive sampling method in an unconfined input space. The proposed machine learning algorithm is tested against uniform sampling on a printed circuit board test structure. We prove allocation of multiple, separated regions with predefined tangential field strengths at MHz frequencies. The feasibility of equivalent magnetic dipole source modeling based on a small number of samples is demonstrated. Compared to uniform testing, progressive expansion sampling detects contours of given field limits in less than 3\% of the reference measurement time.}, language = {en} }