@inproceedings{SeligerHabasGornik1995, author = {Seliger, Norbert and Habas, P. and Gornik, E.}, title = {Modeling and measurements of backside laserprobe signals in MOSFETs}, series = {European Conference on Solid-State Device Research (ESSDERC' 95)}, booktitle = {European Conference on Solid-State Device Research (ESSDERC' 95)}, editor = {de Graaf, H. C. and van Kranenburg, H.}, pages = {773 -- 776}, year = {1995}, language = {en} } @article{SeligerHabašGornik1996, author = {Seliger, Norbert and Habaš, Predrag and Gornik, Erich}, title = {A study of backside laser-probe signals in MOSFETs}, series = {Microelectronic Engineering}, volume = {31}, journal = {Microelectronic Engineering}, number = {1-4}, doi = {10.1016/0167-9317(95)00329-0}, pages = {87 -- 94}, year = {1996}, language = {en} } @inproceedings{PoganyLalinskySeligeretal.1996, author = {Pogany, D. and Lalinsky, T. and Seliger, Norbert and Kuzmik, J. and Habas, P. and Hrkut, P. and Gornik, E.}, title = {Power Sensor Microsystems Characterization using a contactless optical laser method}, series = {International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM' 96)}, booktitle = {International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM' 96)}, pages = {201 -- 204}, year = {1996}, language = {en} } @inproceedings{PoganySeligerLalinskyetal.1996, author = {Pogany, D. and Seliger, Norbert and Lalinsky, T. and Kuzmik, J. and Habas, P. and Hrkut, P. and Gornik, E.}, title = {Study of thermal effects in GaAs micromachined power sensor microsystems by an optical interferometer technique}, series = {International Workshop on Thermal Investigation of ICs and Systems (THERMINIC' 96)}, booktitle = {International Workshop on Thermal Investigation of ICs and Systems (THERMINIC' 96)}, pages = {185 -- 190}, year = {1996}, language = {en} } @inproceedings{SeligerHabasGornik1996, author = {Seliger, Norbert and Habas, P. and Gornik, E.}, title = {Time Domain Characterization of lattice heating in power VDMOSFETs by means of an interferometric laserprobe technique}, series = {Proceedings of the 26th European Solid State Device Research Conference (ESSDERC' 96)}, booktitle = {Proceedings of the 26th European Solid State Device Research Conference (ESSDERC' 96)}, editor = {Baccarani, G. and Rudan, M.}, pages = {847 -- 850}, year = {1996}, language = {en} } @inproceedings{SeligerHabasKoecketal.1996, author = {Seliger, Norbert and Habas, P. and Koeck, A. and Pogany, D. and Gornik, E.}, title = {Backside laserprobing of transient heating in power VDMOSFETs}, series = {International Seminar on Power Semiconductors (ISPS)}, booktitle = {International Seminar on Power Semiconductors (ISPS)}, pages = {115 -- 122}, year = {1996}, language = {en} } @inproceedings{BurianPoganyLalinskyetal.1997, author = {Burian, E. and Pogany, D. and Lalinsky, T. and Seliger, Norbert and Gornik, E.}, title = {Thermal Simulation and characterization of GaAs micromachined power sensor microsystems}, series = {Eurosensors XI}, booktitle = {Eurosensors XI}, pages = {949 -- 952}, year = {1997}, language = {en} } @inproceedings{FuerboeckThalhammerSeligeretal.1997, author = {Fuerboeck, C. and Thalhammer, R. and Seliger, Norbert and Pogany, D. and Deboy, G. and Wachutka, G. and Gornik, E.}, title = {Lokale Temperaturbestimmung in Insulated Gate Bipolar Transistoren (IGBTs) mittels Lasersondentechnik}, series = {Beitr{\"a}ge der Informationstagung ME 97 OVE-Schriftenreihe; Nr. 14 (ISBN 3-85133-010-2)}, volume = {14}, booktitle = {Beitr{\"a}ge der Informationstagung ME 97 OVE-Schriftenreihe; Nr. 14 (ISBN 3-85133-010-2)}, pages = {117 -- 122}, year = {1997}, language = {en} } @article{SeligerPoganyFuerboecketal.1997, author = {Seliger, Norbert and Pogany, D. and Fuerboeck, C. and Habas, P. and Gornik, E.}, title = {A laser beam method for evaluation of thermal time constant in smart power devices}, series = {Microelectronics Reliability}, volume = {37}, journal = {Microelectronics Reliability}, number = {10/11}, doi = {10.1016/S0026-2714(97)00149-2}, pages = {1727 -- 1730}, year = {1997}, language = {en} } @inproceedings{PoganyFuerboeckSeligeretal.1997, author = {Pogany, D. and Fuerboeck, C. and Seliger, Norbert and Habas, P. and Gornik, E. and Kubicek, S. and Decoutere, S.}, title = {Optical Testing of submicron-technology MOSFETs and bipolar transistors}, series = {European Solid-State Device Research Conference (ESSDERC' 97)}, booktitle = {European Solid-State Device Research Conference (ESSDERC' 97)}, editor = {Gr{\"u}nbacher, H.}, pages = {372 -- 375}, year = {1997}, language = {en} }