@inproceedings{F{\"u}rb{\"o}ckPoganyLitzenbergeretal.2023,
  author    = {F{\"u}rb{\"o}ck, C. and Pogany, D. and Litzenberger, M. and Gornik, E. and Seliger, Norbert and Gossner, H. and M{\"u}ller-Lynch, T. and Stecher, M. and Werner, W.},
  title     = {Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices},
  booktitle = {Electrical Overstress/Electrostatic Discharge Symposium Proceedings},
  publisher = {IEEE},
  doi       = {10.1109/EOSESD.1999.819067},
  institution = {Fakult{\"a}t f{\"u}r Ingenieurwissenschaften},
  pages     = {241 -- 250},
  year      = {2023},
  language  = {en}
}