@article{CastellazziKartalKrausetal.2023,
  author    = {Castellazzi, A. and Kartal, V. and Kraus, R. and Seliger, Norbert and Honsberg-Riedl, M. and Schmitt-Landsiedel, D.},
  title     = {Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's},
  journal   = {Microelectronics Reliability},
  volume    = {43},
  number    = {9},
  issn      = {0026-2714},
  doi       = {10.1016/S0026-2714(03)00319-6},
  institution = {Fakult{\"a}t f{\"u}r Ingenieurwissenschaften},
  pages     = {1877 -- 1882},
  year      = {2023},
  language  = {en}
}