TY - CONF A1 - Versen, Martin T1 - Worst Case Test Conditions for Defect Localization in DRAM Devices T2 - Microelectronics Seminar of the ISTFA 2011 KW - DRAM Devices KW - Microelectronics Y1 - 2018 UR - https://opus4.kobv.de/opus4-rosenheim/frontdoor/index/index/docId/669 ER -