TY - JOUR A1 - Castellazzi, A. A1 - Kraus, R. A1 - Seliger, Norbert A1 - Schmitt-Landsiedel, D. T1 - Reliability analysis of power MOSFET’s with the help of compact models and circuit simulation T2 - Microelectronics Reliability Y1 - 2023 UR - https://opus4.kobv.de/opus4-rosenheim/frontdoor/index/index/docId/2229 SN - 0026-2714 VL - 42 IS - 9 SP - 1605 EP - 1610 ER -