@article{KanertDettmerPlikatetal.2003, author = {W. Kanert and H. Dettmer and B. Plikat and Norbert Seliger}, title = {Reliability aspects of semiconductor devices in high temperature applications}, journal = {Microelectronics Reliability}, volume = {43}, number = {9}, pages = {1839 -- 1846}, doi = {10.1016/S0026-2714(03)00313-5}, year = {2003}, }