@article{CastellazziKartalKrausetal.2003, author = {A. Castellazzi and V. Kartal and R. Kraus and Norbert Seliger and M. Honsberg-Riedl and D. Schmitt-Landsiedel}, title = {Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's}, journal = {Microelectronics Reliability}, volume = {43}, number = {9}, pages = {1877 -- 1882}, doi = {10.1016/S0026-2714(03)00319-6}, year = {2003}, }