TY - JOUR A1 - Castellazzi, A. A1 - Kartal, V. A1 - Kraus, R. A1 - Seliger, Norbert A1 - Honsberg-Riedl, M. A1 - Schmitt-Landsiedel, D. T1 - Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET’s T2 - Microelectronics Reliability Y1 - 2023 UR - https://opus4.kobv.de/opus4-rosenheim/frontdoor/index/index/docId/2228 SN - 0026-2714 VL - 43 IS - 9 SP - 1877 EP - 1882 ER -