TY - CHAP A1 - Versen, Martin A2 - Gandhi, Tejinder T1 - DRAM Failure Analysis and Defect Localization Techniques T2 - Microelectronics Failure Analysis, Desk Reference KW - Failure Analysis Y1 - 2019 UR - https://opus4.kobv.de/opus4-rosenheim/frontdoor/index/index/docId/1323 SN - 978-1-62708-247-1 SP - 499 EP - 505 PB - ASM International CY - Ohio ER -